Virendra Singh (ed.) | Akateeminen Kirjakauppa

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VLSI DESIGN AND TEST : 17TH INTERNATIONAL SYMPOSIUM, VDAT 2013, JAIPUR, INDIA, JULY 27-30, 2013, PROCEEDINGS

Manoj Singh Gaur (ed.); Mark Zwolinski (ed.); Vijay Laxmi (ed.); D. Boolchandani (ed.); Virendra Sing (ed.); Adit (e Singh
Springer (2013)
Saatavuus: Tilaustuote
Pehmeäkantinen kirja

49,60 €

EXACTLY SOLVABLE PROBLEMS IN CONDENSED MATTER AND RELATIVISTIC FIELD THEORY : PROCEEDINGS OF THE WINTER SCHOOL AND INTERNATIONAL

Sriram B. Shastry (ed.); Sudhanshu S. Jha (ed.); Virendra Singh (ed.)
Springer (1985)
Saatavuus: Tilaustuote
Pehmeäkantinen kirja

97,90 €

VLSI DESIGN AND TEST : 21ST INTERNATIONAL SYMPOSIUM, VDAT 2017, ROORKEE, INDIA, JUNE 29 – JULY 2, 2017, REVISED SELECTED PAPERS

Brajesh Kumar Kaushik (ed.); Sudeb Dasgupta (ed.); Virendra Singh (ed.)
Springer (2017)
Saatavuus: Tilaustuote
Pehmeäkantinen kirja

97,90 €

VLSI DESIGN AND TEST : 22ND INTERNATIONAL SYMPOSIUM, VDAT 2018, MADURAI, INDIA, JUNE 28-30, 2018, REVISED SELECTED PAPERS

S. Rajaram (ed.); N.B. Balamurugan (ed.); D. Gracia Nirmala Rani (ed.); Virendra Singh (ed.)
Springer (2019)
Saatavuus: Tilaustuote
Pehmeäkantinen kirja

97,90 €

VLSI DESIGN AND TEST : 23RD INTERNATIONAL SYMPOSIUM, VDAT 2019, INDORE, INDIA, JULY 4–6, 2019, REVISED SELECTED PAPERS

Anirban Sengupta (ed.); Sudeb Dasgupta (ed.); Virendra Singh (ed.); Rohit Sharma (ed.); Santosh Kumar Vishvakarma (ed.)
Springer (2019)
Saatavuus: Tilaustuote
Pehmeäkantinen kirja

105,60 €

VLSI Design and Test : 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings

Manoj Singh Gaur (ed.), Mark Zwolinski (ed.), Vijay Laxmi (ed.), D. Boolchandani (ed.), Virendra Sing (ed.), Adit (e Singh

49,60 €

Springer
Sivumäärä: 388 sivua
Asu: Pehmeäkantinen kirja
Painos: 2013
Julkaisuvuosi: 2013, 10.12.2013 (lisätietoa)
Kieli: Englanti

This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.

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