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VLSI DESIGN AND TEST : 17TH INTERNATIONAL SYMPOSIUM, VDAT 2013, JAIPUR, INDIA, JULY 27-30, 2013, PROCEEDINGS

Tekijä: Manoj Singh Gaur (ed.); Mark Zwolinski (ed.); Vijay Laxmi (ed.); D. Boolchandani (ed.); Virendra Sing (ed.); Adit (e Singh
Kustantaja: Springer (2013)
Saatavuus: Noin 17-20 arkipäivää

EUR 49,60

EXACTLY SOLVABLE PROBLEMS IN CONDENSED MATTER AND RELATIVISTIC FIELD THEORY : PROCEEDINGS OF THE WINTER SCHOOL AND INTERNATIONAL

Tekijä: Sriram B. Shastry (ed.); Sudhanshu S. Jha (ed.); Virendra Singh (ed.)
Kustantaja: Springer (1985)
Saatavuus: Noin 17-20 arkipäivää

EUR 97,90

VLSI DESIGN AND TEST : 21ST INTERNATIONAL SYMPOSIUM, VDAT 2017, ROORKEE, INDIA, JUNE 29 – JULY 2, 2017, REVISED SELECTED PAPERS

Tekijä: Brajesh Kumar Kaushik (ed.); Sudeb Dasgupta (ed.); Virendra Singh (ed.)
Kustantaja: Springer (2017)
Saatavuus: Noin 17-20 arkipäivää

EUR 97,90

INFORMATION SYSTEMS SECURITY : 13TH INTERNATIONAL CONFERENCE, ICISS 2017, MUMBAI, INDIA, DECEMBER 16-20, 2017, PROCEEDINGS

Tekijä: Rudrapatna K. Shyamasundar (ed.); Virendra Singh (ed.); Jaideep Vaidya (ed.)
Kustantaja: Springer (2017)
Saatavuus: Noin 17-20 arkipäivää

EUR 49,60

VLSI DESIGN AND TEST : 22ND INTERNATIONAL SYMPOSIUM, VDAT 2018, MADURAI, INDIA, JUNE 28-30, 2018, REVISED SELECTED PAPERS

Tekijä: S. Rajaram (ed.); N.B. Balamurugan (ed.); D. Gracia Nirmala Rani (ed.); Virendra Singh (ed.)
Kustantaja: Springer (2019)
Saatavuus: Noin 17-20 arkipäivää

EUR 97,90

SECURITY AND PRIVACY : SECOND ISEA INTERNATIONAL CONFERENCE, ISEA-ISAP 2018, JAIPUR, INDIA, JANUARY, 9–11, 2019, REVISED SELECTE

Tekijä: Sukumar Nandi (ed.); Devesh Jinwala (ed.); Virendra Singh (ed.); Vijay Laxmi (ed.); Manoj Singh Gaur (ed.); Parvez Faruki
Kustantaja: Springer (2019)
Saatavuus: Noin 17-20 arkipäivää

EUR 49,60

VLSI DESIGN AND TEST : 23RD INTERNATIONAL SYMPOSIUM, VDAT 2019, INDORE, INDIA, JULY 4–6, 2019, REVISED SELECTED PAPERS

Tekijä: Anirban Sengupta (ed.); Sudeb Dasgupta (ed.); Virendra Singh (ed.); Rohit Sharma (ed.); Santosh Kumar Vishvakarma (ed.)
Kustantaja: Springer (2019)
Saatavuus: Noin 17-20 arkipäivää

EUR 105,60

VLSI Design and Test : 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings

Manoj Singh Gaur (ed.), Mark Zwolinski (ed.), Vijay Laxmi (ed.), D. Boolchandani (ed.), Virendra Sing (ed.), Adit (e Singh

49,60 €

Springer
Sivumäärä: 388 sivua
Asu: Pehmeäkantinen kirja
Painos: 2013
Julkaisuvuosi: 2013, 10.12.2013 (lisätietoa)
Kieli: Englanti

This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.

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