VLSI Design and Test : 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings, Gaur, Manoj Singh (ed.); Zwolinski, Mark (ed.); Laxmi, Vijay (ed.); Boolchandani, D. (ed.); Sing, Virendra (ed.); Singh, Adit (e, Springer

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VLSI Design and Test : 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings

Manoj Singh Gaur (ed.), Mark Zwolinski (ed.), Vijay Laxmi (ed.), D. Boolchandani (ed.), Virendra Sing (ed.), Adit (e Singh

49,60 €

Springer
Sivumäärä: 388 sivua
Asu: Pehmeäkantinen kirja
Painos: 2013
Julkaisuvuosi: 2013, 10.12.2013 (lisätietoa)
Kieli: Englanti
Tuotesarja: Communications in Computer and Information Science 382

This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.

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