VLSI Design and Test : 26th International Symposium, VDAT 2022, Jammu, India, July 17–19, 2022, Revised Selected Papers, Shah, Ambika Prasad (ed.); Dasgupta, Sudeb (ed.); Darji, Anand (ed.); Tudu, Jaynarayan (ed.), Springer

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VLSI Design and Test : 26th International Symposium, VDAT 2022, Jammu, India, July 17–19, 2022, Revised Selected Papers

Ambika Prasad Shah (ed.), Sudeb Dasgupta (ed.), Anand Darji (ed.), Jaynarayan Tudu (ed.)

97,90 €

Springer
Sivumäärä: 596 sivua
Asu: Pehmeäkantinen kirja
Julkaisuvuosi: 2022, 17.12.2022 (lisätietoa)
Kieli: Englanti

This book constitutes the proceedings of the 26th International Symposium on VLSI Design and Test, VDAT 2022, which took place in Jammu, India, in July 2022.

The 32 regular papers and 16 short papers presented in this volume were carefully reviewed and selected from 220 submissions. They were organized in topical sections as follows: Devices and Technology; Sensors; Analog/Mixed Signal; Digital Design; Emerging Technologies and Memory; System Design.

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