This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.

Contributions by: Khader S. Abdel-Hafez, Wen-Ben Jone, Rohit Kapur, Brion Keller, Kuen-Jong Lee, James C.-M. Li, Mike Peng Li, Xiaowei Li, T.M. Mak, Yinghua Min, Benoit Nadeau-Dostie, Soumendu Bhattacharya, Mehrdad Nourani, Janusz Rajski, Charles Stroud, Erik H. Volkerink, Duncan M. (Hank) Walker, Shianling Wu, Nur A. Touba, Abhijit Chatterjee, Xinghao Chen, Kwang-Ting (Tim) Cheng, William Eklow, Michael S. Hsiao, Jiun-Lang Huang, Shi-Yu Huang