Structural, Syntactic, and Statistical Pattern Recognition : Joint IAPR International Workshops, S+SSPR 2020, Padua, Italy, Janu, Torsello, Andrea (ed.); Rossi, Luca (ed.); Pelillo, Marcello (ed.); Biggio, Battista (ed.); Robles-Kelly, Antonio (ed.), Springer

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Structural, Syntactic, and Statistical Pattern Recognition : Joint IAPR International Workshops, S+SSPR 2020, Padua, Italy, Janu

Andrea Torsello (ed.), Luca Rossi (ed.), Marcello Pelillo (ed.), Battista Biggio (ed.), Antonio Robles-Kelly (ed.)

49,60 €

Springer
Sivumäärä: 378 sivua
Asu: Pehmeäkantinen kirja
Julkaisuvuosi: 2021, 10.04.2021 (lisätietoa)
Kieli: Englanti
Tuotesarja: Image Processing, Computer Vision, Pattern Recognition, and Graphics

This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2020, held in Padua, Italy, in January 2021.

The 35 papers presented in this volume were carefully reviewed and selected from 81 submissions.

The accepted papers cover the major topics of current interest in pattern recognition, including classification and clustering, deep learning, structural matching and graph-theoretic methods, and multimedia analysis and understanding.

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