This book explains in a straightforward manner the complex phenomenon of low-frequency noise, its physical origin and mechanism in Metal Oxide Semiconductor devices.  Coverage includes the physics and math of noise, how to characterize, simulate and model noise at a device and circuit level, as well as its relationship to other device parameters.  Readers will learn how either to optimize or minimize this parameter at different levels of semiconductor processes and design, its impact on device and circuit reliability, what forms would it take and how would it behave under various circumstances. Detailed explanations are included of what would be the impact of low-frequency noise on different types of devices and circuits in various electrical/physical environments, how and when to identify its criticality during circuit design, how to suppress its behavior by effective engineering and the trade-offs for a successful product design.