As integrated circuits are being designed with faster speed, more complexity, and higher density, the costs of testing them escalates. Traditional testing mechanisms are specification-based and incapable of meeting current pressures for test cost reduction. In addition, with the rapid growth of the wireless telecommunications industry, testing of RF and PLL circuitry has become vitally important. The test costs associated with RF systems is considerable, affecting both time-to-market and product cost requirements. This book serves as a must-have reference to the most efficient, embedded Design-for-Test (DFT) methods for RF/PLL circuits and systems. The main focus is on practical and implementation aspects and the techniques and methodologies presented are supported by extensive use of real silicon data.