SULJE VALIKKO

avaa valikko

CMOS Cantilever Sensor Systems : Atomic Force Microscopy and Gas Sensing Applications
97,90 €
Springer
Sivumäärä: 142 sivua
Asu: Pehmeäkantinen kirja
Julkaisuvuosi: 2010, 04.12.2010 (lisätietoa)
Kieli: Englanti
This book is intended for scientists and engineers in the field of micro- and nano­ electro-mechanical systems (MEMS and NEMS) and introduces the development of cantilever-based sensor systems using CMOS-compatible micromachining from the design concepts and simulations to the prototype. It is also a useful resource for researchers on cantilever sensors and resonant sensors in general The reader will become familiar with the potential of the combination of two technological approaches: IC fabrication technology, notably CMOS technology, and silicon micromachining and the resulting microstructures such as cantilever beams. It was recognized early that these two technologies should be merged in order to make the microstructures smart and devise integrated microsystems with on-chip driving and signal conditioning circuitry - now known as CMOS MEMS or, with the arrival of nanostructures, CMOS NEMS. One way to achieve the merger is the post-processing micro- or nano- machining of finished CMOS wafers, some of which is described in this book. The book introduces this approach based on work carried out at the Physical Electronics Laboratory of ETH Zurich on arrays of cantilever transducers with on-chip driving and signal conditioning circuitry. These cantilevers are familiar from Scanning Probe Microscopy (SPM) and allow the sensitive detection of phys­ ical quantities such as forces and mass changes. The book is divided into three parts. First, general aspects of cantilever resona­ tors are introduced, e. g. their resonant behavior and possible driving and sensing mechanisms.

Tuotetta lisätty
ostoskoriin kpl
Siirry koriin
LISÄÄ OSTOSKORIIN
Tilaustuote | Arvioimme, että tuote lähetetään meiltä noin 16-19 arkipäivässä
Myymäläsaatavuus
Helsinki
Tapiola
Turku
Tampere
CMOS Cantilever Sensor Systems : Atomic Force Microscopy and Gas Sensing Applicationszoom
Näytä kaikki tuotetiedot
ISBN:
9783642077289
Sisäänkirjautuminen
Kirjaudu sisään
Rekisteröityminen
Oma tili
Omat tiedot
Omat tilaukset
Omat laskut
Lisätietoja
Asiakaspalvelu
Tietoa verkkokaupasta
Toimitusehdot
Tietosuojaseloste