Manoj Singh Gaur | Akateeminen Kirjakauppa

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VLSI DESIGN AND TEST : 17TH INTERNATIONAL SYMPOSIUM, VDAT 2013, JAIPUR, INDIA, JULY 27-30, 2013, PROCEEDINGS

Manoj Singh Gaur (ed.); Mark Zwolinski (ed.); Vijay Laxmi (ed.); D. Boolchandani (ed.); Virendra Sing (ed.); Adit (e Singh
Springer (2013)
Pehmeäkantinen kirja

49,60 €

INFORMATION SYSTEMS SECURITY - 12TH INTERNATIONAL CONFERENCE, ICISS 2016, JAIPUR, INDIA, DECEMBER 16-20, 2016, PROCEEDINGS

Indrajit Ray; Manoj Singh Gaur; Mauro Conti; Dheeraj Sanghi; V. Kamakoti
Springer International Publishing AG (2016)
Pehmeäkantinen kirja

49,60 €

SECURITY AND PRIVACY - SECOND ISEA INTERNATIONAL CONFERENCE, ISEA-ISAP 2018, JAIPUR, INDIA, JANUARY, 9–11, 2019, REVISED SELECTE

Sukumar Nandi; Devesh Jinwala; Virendra Singh; Vijay Laxmi; Manoj Singh Gaur; Parvez Faruki
Springer Verlag, Singapore (2019)
Pehmeäkantinen kirja

49,60 €

COMPOSITE MATERIALS PROCESSING USING MICROWAVE HEATING TECHNOLOGY

Manoj Kumar Singh; Gaurav Arora; Sunny Zafar; Sanjay Mavinkere Rangappa; Suchart Siengchin
Springer Verlag, Singapore (2024)
Kovakantinen kirja

155,60 €

SUSTAINABLE LAND MANAGEMENT IN INDIA : OPPORTUNITIES AND CHALLENGES

Gaurav Mishra (ed.); Krishna Giri (ed.); Sanjay Singh (ed.); Manoj Kumar (ed.)
Springer (2024)
Kovakantinen kirja

190,00 €

VLSI Design and Test : 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings

Manoj Singh Gaur (ed.), Mark Zwolinski (ed.), Vijay Laxmi (ed.), D. Boolchandani (ed.), Virendra Sing (ed.), Adit (e Singh

49,60 €

Springer
Sivumäärä: 388 sivua
Asu: Pehmeäkantinen kirja
Painos: 2013
Julkaisuvuosi: 2013, 10.12.2013 (lisätietoa)
Kieli: Englanti
Tuotesarja: Communications in Computer and Information Science 382

This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.

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