Scanning Tunneling Microscopy I provides a unique introduction to a novel and fascinating technique that produces beautiful images of nature on an atomic scale. It is the first of three volumes that together offer a comprehensive treatment of scanning tunneling microscopy, its diverse applications, and its theoretical treatment. In this volume the reader will find a detailed description of the technique itself and of its applications to metals, semiconductors, layered materials, adsorbed molecules and superconductors. In addition to the many representative results reviewed, extensive references to original work will help to make accessible the vast body of knowledge already accumulated in this field.

Contributions by: D. Anselmetti, R.J. Behm, P.J.M. van Bentum, S. Chiang, Hans-Joachim Güntherodt, R.J. Hamers, H. van Kempen, Y. Kuk, H. Rohrer, Roland Wiesendanger, J. Wintterlin