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Scanning Electron Microscopy and X-Ray Microanalysis
Joseph I. Goldstein; Dale E. Newbury; Joseph R. Michael; Nicholas W.M. Ritchie; John Henry J. Scott; David C. Joy
Springer-Verlag New York Inc. (2018)
Pehmeäkantinen kirja
97,90
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Debate On Woman Suffrage In The Senate Of The United States, 2d Session, 49th Congress, December 8, 1886, And January 25, 1887
Henry W Blair; J E Brown
Alpha Edition (2021)
Pehmeäkantinen kirja
22,30
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ostoskoriin kpl
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Exposition of I&II Samuel
Matthew Henry; J. Gill; A. W. Pink
Sovereign Grace Publishers (2001)
Kovakantinen kirja
45,30
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The Reporter's Handbook on Nuclear Materials, Energy, and Waste Management
Michael R. Greenberg; Bernadette M. West; Karen W. Lowrie; Henry J. Mayer
Vanderbilt University Press (2009)
Kovakantinen kirja
102,20
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The Reporter's Handbook on Nuclear Materials, Energy, and Waste Management
Michael R. Greenberg; Bernadette M. West; Karen W. Lowrie; Henry J. Mayer
Vanderbilt University Press (2009)
Pehmeäkantinen kirja
40,70
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International Management Behavior
Henry W. Lane; Martha Maznevski; Joerg Dietz; Joseph J. DiStefano
John Wiley & Sons (2009)
Pehmeäkantinen kirja
50,80
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English Verse
Henry Stoddard; W J Linton Richard
BiblioLife (2009)
Pehmeäkantinen kirja
65,40
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English Verse
Henry Stoddard; W J Linton Richard
BiblioLife (2009)
Kovakantinen kirja
82,80
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Dolce Far Niente.
J. W. Henry
Cambridge Scholars Publishing (2010)
Pehmeäkantinen kirja
53,40
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The History of Great Britain, from the First Invasion by the Romans Under Julius Caesar
Dr Robert Henry; And J Allman T and J Allman; Baynes And Son W Baynes and Son; T and J Allman; W Baynes and Son
BiblioLife (2010)
Kovakantinen kirja
97,10
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Dolce Far Niente.
J. W. Henry
Nabu Press (2010)
Pehmeäkantinen kirja
52,90
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Theodore Low de Vinne, Printer
J. W. Bothwell; Henry Lewis Bullen; De Vinne Press Bkp Cu-Banc
Nabu Press (2010)
Pehmeäkantinen kirja
51,60
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Town of Pana V. Bowler, et al. U.S. Supreme Court Transcript of Record with Supporting Pleadings
W J Henry; George A Sanders; U S Supreme Court
Gale Ecco, U.S. Supreme Court Records (2011)
Pehmeäkantinen kirja
72,00
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Markham V. People of State of Illinois Ex Rel Cromer U.S. Supreme Court Transcript of Record with Supporting Pleadings
Charles J Monahan; George W Howard; Henry I Green
Gale, U.S. Supreme Court Records (2011)
Pehmeäkantinen kirja
62,00
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Tucker V. Cutler U.S. Supreme Court Transcript of Record with Supporting Pleadings
Daniel W Davies; Henry J Cook
Gale, U.S. Supreme Court Records (2011)
Pehmeäkantinen kirja
60,70
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Hotel and Restaurant Emp and Bartenders Intern Union, Local No 181 V. Blue Boar Cafeteria Co U.S. Supreme Court Transcript of Re
J W Brown; Henry T Merritt
Gale Ecco, U.S. Supreme Court Records (2011)
Pehmeäkantinen kirja
64,50
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Macrocyclic Chemistry - New Research Developments
Dániel W Fitzpatrick; Henry J Ulrich
Nova Science Publishers Inc (2010)
Kovakantinen kirja
212,80
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Molecular Basis of Reproductive Endocrinology
Peter C.K. Leung; Aaron J.W. Hsueh; Henry G. Friesen
Springer-Verlag New York Inc. (2011)
Pehmeäkantinen kirja
49,60
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Environmental Science and Engineering
D. J. Henry; Gary W. Heinke
(1995)
Pehmeäkantinen kirja
179,10
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Environmental Science and Engineering
D. J. Henry; Gary W. Heinke
(1996)
Kovakantinen kirja
177,30
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Scanning Electron Microscopy and X-Ray Microanalysis
97,90 €
Springer-Verlag New York Inc.
Sivumäärä: 550 sivua
Asu: Pehmeäkantinen kirja
Painos: 4th ed. 2018
Julkaisuvuosi: 2018, 30.08.2018 (lisätietoa)
Kieli: Englanti
This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysis (EBSD) for micro-crystallography, and focused ion beams. Students and academic researchers will find the text to be an authoritative and scholarly resource, while SEM operators and a diversity of practitioners — engineers, technicians, physical and biological scientists, clinicians, and technical managers — will find that every chapter has been overhauled to meet the more practical needs of the technologist and working professional. In a break with the past, this Fourth Edition de-emphasizes the design and physical operating basis of the instrumentation, including the electron sources, lenses, detectors, etc. In the modern SEM, many of the low level instrument parameters are now controlled and optimized by the microscope’s software, and user access is restricted. Although the software control system provides efficient and reproducible microscopy and microanalysis, the user must understand the parameter space wherein choices are made to achieve effective and meaningful microscopy, microanalysis, and micro-crystallography. Therefore, special emphasis is placed on beam energy, beam current, electron detector characteristics and controls, and ancillary techniques such as energy dispersive x-ray spectrometry (EDS) and electron backscatter diffraction (EBSD).
With 13 years between the publication of the third and fourth editions, new coverage reflects the many improvements in the instrument and analysis techniques. The SEM has evolved into a powerful and versatile characterization platform in which morphology, elemental composition, and crystal structure can be evaluated simultaneously. Extension of the SEM into a "dual beam" platform incorporating bothelectron and ion columns allows precision modification of the specimen by focused ion beam milling. New coverage in the Fourth Edition includes the increasing use of field emission guns and SEM instruments with high resolution capabilities, variable pressure SEM operation, theory, and measurement of x-rays with high throughput silicon drift detector (SDD-EDS) x-ray spectrometers. In addition to powerful vendor- supplied software to support data collection and processing, the microscopist can access advanced capabilities available in free, open source software platforms, including the National Institutes of Health (NIH) ImageJ-Fiji for image processing and the National Institute of Standards and Technology (NIST) DTSA II for quantitative EDS x-ray microanalysis and spectral simulation, both of which are extensively used in this work. However, the user has a responsibility to bring intellect, curiosity, and a proper skepticism to information on a computer screen and to the entire measurement process. This book helps you to achieve this goal.

Realigns the text with the needs of a diverse audience from researchers and graduate students to SEM operators and technical managers

Emphasizes practical, hands-on operation of the microscope, particularly user selection of the critical operating parameters to achieve meaningful results

Provides step-by-step overviews of SEM, EDS, and EBSD and checklists of critical issues for SEM imaging, EDS x-ray microanalysis, and EBSD crystallographic measurements

Makes extensive use of open source software: NIH ImageJ-FIJI for image processing and NIST DTSA II for quantitative EDS x-ray microanalysis and EDS spectral simulation.

Includes case studies to illustrate practical problem solving

Covers Helium ion scanning microscopy

Organized into relatively self-contained modules – no need to "read it all" to understand a topic

Includesan online supplement—an extensive "Database of Electron–Solid Interactions"—which can be accessed on SpringerLink, in Chapter 3

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Tilaustuote | Arvioimme, että tuote lähetetään meiltä noin 4-5 viikossa | Tilaa jouluksi viimeistään 27.11.2024
Myymäläsaatavuus
Helsinki
Tapiola
Turku
Tampere
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ISBN:
9781493982691
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