IOS Press Sivumäärä: 594 sivua Asu: Kovakantinen kirja Painos: ILLUSTRATED ED Julkaisuvuosi: 2005, 01.01.2005 (lisätietoa) Kieli: Englanti
The book is a collection of articles covering basic crystallography, local texture measurements with high energy synchrotron radiation, evolution of textures, texture mapping by scanning X-ray diffraction, absorption tomography for three dimensional measurements in bulk materials, ultra thin films specular X-ray reflectivity, small angle X-ray scattering, glancing incidence X-ray diffraction and X-ray line profile analysis. A large number of chapters cover the application of the Rietveld refinement technique for different materials. The application of high temperature X-ray diffraction to different materials is also discussed. Apart from this the application of X-ray diffraction techniques to characterize the materials is dealt with in different areas; such as magnetic materials, nano materials, aluminum alloys, titanium alloys, biomaterials, forensic application of textile fabrics, sensors, steels and surface modifications. It also covers the geometrical aspects of X-ray diffractometer and related applications.
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