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Michael Joseph R. Michael | Akateeminen Kirjakauppa

Haullasi löytyi yhteensä 37 tuotetta
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Scanning Electron Microscopy and X-Ray Microanalysis
Joseph I. Goldstein; Dale E. Newbury; Joseph R. Michael; Nicholas W.M. Ritchie; John Henry J. Scott; David C. Joy
Springer-Verlag New York Inc. (2017)
Kovakantinen kirja
107,50
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Scanning Electron Microscopy and X-Ray Microanalysis
Joseph I. Goldstein; Dale E. Newbury; Joseph R. Michael; Nicholas W.M. Ritchie; John Henry J. Scott; David C. Joy
Springer-Verlag New York Inc. (2018)
Pehmeäkantinen kirja
97,90
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ostoskoriin kpl
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Scanning Electron Microscopy and X-Ray Microanalysis
Goldstein Joseph I. Goldstein; Newbury Dale E. Newbury; Michael Joseph R. Michael
Springer Nature B.V. (2017)
Pehmeäkantinen kirja
117,90
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ostoskoriin kpl
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Meeting the Challenge of Adolescent Literacy - Research We Have, Research We Need
Edited by Mark W. Conley; Joseph R. Freidhoff; Michael B. Sherry and Steven Forbes Tuckey
Guilford Press (TANDF) (2008)
Kovakantinen kirja
42,80
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Meeting the Challenge of Adolescent Literacy - Research We Have, Research We Need
Mark W. Conley; Joseph R. Freidhoff; Michael B. Sherry; Steven Forbes Tuckey; Charles Anderson
Guilford Publications (2008)
Pehmeäkantinen kirja
28,60
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Forest Entomology in West Tropical Africa: Forest Insects of Ghana
Michael R. Wagner; Joseph R. Cobbinah; Paul P. Bosu
Springer-Verlag New York Inc. (2007)
Kovakantinen kirja
129,90
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Paul and the Second Century
Michael F. Bird; Joseph R. Dodson
Bloomsbury Publishing PLC (2011)
Kovakantinen kirja
130,20
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Forest Entomology in West Tropical Africa: Forest Insects of Ghana
Michael R. Wagner; Joseph R. Cobbinah; Paul P. Bosu
SPRINGER VERLAG GMBH (2008)
Pehmeäkantinen kirja
66,10
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Aprende A Usar y Dirigir la Energia - Manual Practico de Curacion Energetica
R Michael Miller; Josephine M Harper
Editorial Sirio (2012)
Pehmeäkantinen kirja
12,00
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Measurements in Spine Care
Jens R. Chapman; Michael J. Lee; Jeffrey T. Hermsmeyer; Joseph R. Dettori; Daniel C. Norvell
Thieme Publishing Group (2012)
Kovakantinen kirja
179,90
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Paul and the Second Century
Michael F. Bird; Joseph R. Dodson
Bloomsbury Publishing PLC (2012)
Pehmeäkantinen kirja
52,90
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SMART Approach to Spine Clinical Research
Michael J. Lee; Daniel C. Norvell; Joseph R. Dettori; Andrea C Skelly; Jens R. Chapman
Thieme Publishing Group (2013)
Kovakantinen kirja
101,50
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Green Awareness - Energy Efficiency, Comfort Conditioning, Electrical, Plumbing
Michael J Korcal; Petit, Randy F, Sr.; Joseph R Pacella; Philip Campbell; Turner Collins; Erik Rasmussen
Esco Institute (2008)
Kierreselkäinen
114,60
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Biomedical Vibrational Spectroscopy and Biohazard Detection Technologies
Anita Mahadevan-Jansen; Michael G. Sowa; Gerwin J. Puppels; Zygmunt Gryczynski; Tuan Vo-Dinh; Joseph R. Lakowicz
SPIE Press (2004)
Pehmeäkantinen kirja
222,90
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The California State Constitution
Joseph R. Grodin; Michael B. Salerno; Darien Shanske
Oxford University Press Inc (2016)
Kovakantinen kirja
240,00
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The California State Constitution
Joseph R. Grodin; Darien Shanske; Michael B. Salerno
Oxford University Press Inc (2017)
Pehmeäkantinen kirja
63,10
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Climate Change and Estuaries
Michael J. Kennish; Hans W. Paerl; Joseph R. Crosswell
Taylor & Francis Ltd (2023)
Kovakantinen kirja
280,20
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Clinical Engineering
Yadin David; Wolf W. von Maltzahn; Michael R. Neuman; Joseph D. Bronzino
Taylor & Francis Inc (2003)
Kovakantinen kirja
213,30
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Chemotaxis
Michael Eisenbach; A Tamada; G M Omann; J E Segall; R A Firtel; R Meili; David Gutnick; Mazal Varon; Joseph W Lengeler
Imperial College Press (2004)
Kovakantinen kirja
148,30
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The Global Workplace: International and Comparative Employment Law - Cases and Materials
Roger Blanpain; Susan Bisom-Rapp; William R. Corbett; Hilary K. Josephs; Michael J. Zimmer
Cambridge University Press (2007)
Kovakantinen kirja
93,90
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Scanning Electron Microscopy and X-Ray Microanalysis
107,50 €
Springer-Verlag New York Inc.
Sivumäärä: 550 sivua
Asu: Kovakantinen kirja
Painos: 4th ed. 2018
Julkaisuvuosi: 2017, 18.11.2017 (lisätietoa)
Kieli: Englanti
This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysis (EBSD) for micro-crystallography, and focused ion beams. Students and academic researchers will find the text to be an authoritative and scholarly resource, while SEM operators and a diversity of practitioners — engineers, technicians, physical and biological scientists, clinicians, and technical managers — will find that every chapter has been overhauled to meet the more practical needs of the technologist and working professional. In a break with the past, this Fourth Edition de-emphasizes the design and physical operating basis of the instrumentation, including the electron sources, lenses, detectors, etc. In the modern SEM, many of the low level instrument parameters are now controlled and optimized by the microscope’s software, and user access is restricted. Although the software control system provides efficient and reproducible microscopy and microanalysis, the user must understand the parameter space wherein choices are made to achieve effective and meaningful microscopy, microanalysis, and micro-crystallography. Therefore, special emphasis is placed on beam energy, beam current, electron detector characteristics and controls, and ancillary techniques such as energy dispersive x-ray spectrometry (EDS) and electron backscatter diffraction (EBSD).
With 13 years between the publication of the third and fourth editions, new coverage reflects the many improvements in the instrument and analysis techniques. The SEM has evolved into a powerful and versatile characterization platform in which morphology, elemental composition, and crystal structure can be evaluated simultaneously. Extension of the SEM into a "dual beam" platform incorporating bothelectron and ion columns allows precision modification of the specimen by focused ion beam milling. New coverage in the Fourth Edition includes the increasing use of field emission guns and SEM instruments with high resolution capabilities, variable pressure SEM operation, theory, and measurement of x-rays with high throughput silicon drift detector (SDD-EDS) x-ray spectrometers. In addition to powerful vendor- supplied software to support data collection and processing, the microscopist can access advanced capabilities available in free, open source software platforms, including the National Institutes of Health (NIH) ImageJ-Fiji for image processing and the National Institute of Standards and Technology (NIST) DTSA II for quantitative EDS x-ray microanalysis and spectral simulation, both of which are extensively used in this work. However, the user has a responsibility to bring intellect, curiosity, and a proper skepticism to information on a computer screen and to the entire measurement process. This book helps you to achieve this goal.

Realigns the text with the needs of a diverse audience from researchers and graduate students to SEM operators and technical managers

Emphasizes practical, hands-on operation of the microscope, particularly user selection of the critical operating parameters to achieve meaningful results

Provides step-by-step overviews of SEM, EDS, and EBSD and checklists of critical issues for SEM imaging, EDS x-ray microanalysis, and EBSD crystallographic measurements

Makes extensive use of open source software: NIH ImageJ-FIJI for image processing and NIST DTSA II for quantitative EDS x-ray microanalysis and EDS spectral simulation.

Includes case studies to illustrate practical problem solving

Covers Helium ion scanning microscopy

Organized into relatively self-contained modules – no need to "read it all" to understand a topic

Includesan online supplement—an extensive "Database of Electron–Solid Interactions"—which can be accessed on SpringerLink, in Chapter 3

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Tilaustuote | Arvioimme, että tuote lähetetään meiltä noin 4-5 viikossa | Tilaa jouluksi viimeistään 27.11.2024
Myymäläsaatavuus
Helsinki
Tapiola
Turku
Tampere
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ISBN:
9781493966745
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