Silva-martinez, Jose (Texas A&m Univ, Usa); Onabajo, Marvin (Northeastern Univ, Usa) World Scientific Publishing Co Pte Ltd (2024) Pehmeäkantinen kirja
Springer Sivumäärä: 174 sivua Asu: Kovakantinen kirja Painos: 2012 Julkaisuvuosi: 2012, 08.03.2012 (lisätietoa) Kieli: Englanti
This book describes several techniques to address variation-related design challenges for analog blocks in mixed-signal systems-on-chip. The methods presented are results from recent research works involving receiver front-end circuits, baseband filter linearization, and data conversion. These circuit-level techniques are described, with their relationships to emerging system-level calibration approaches, to tune the performances of analog circuits with digital assistance or control. Coverage also includes a strategy to utilize on-chip temperature sensors to measure the signal power and linearity characteristics of analog/RF circuits, as demonstrated by test chip measurements.
Describes a variety of variation-tolerant analog circuit design examples, including from RF front-ends, high-performance ADCs and baseband filters;
Includes built-in testing techniques, linked to current industrial trends;
Balances digitally-assisted performance tuning with analog performance tuning and mismatch reduction approaches;
Describes theoretical concepts as well as experimental results for test chips designed with variation-aware techniques.
