Jian Ping Li; Igor Bloshanskii; Lionel M Ni; S S Pandey; Simon X Yang World Scientific Publishing Co Pte Ltd (2008) Saatavuus: Tilaustuote Pehmeäkantinen kirja
Springer Sivumäärä: 272 sivua Asu: Kovakantinen kirja Painos: 2003 Julkaisuvuosi: 2003, 31.07.2003 (lisätietoa) Kieli: Englanti
Fractal analysis has rapidly become an important field in materials science and engineering with broad applications to theoretical analysis and quantitative description of microstructures of materials. Fractal methods have thus far shown great potential in engineering applications in quantitative microscopic analysis of materials using commercial microscopes. This book attempts to introduce the fundamentals and the basis methods of fractal description of microstructures in combination with digital imaging and computer technologies. Basic concepts are given in the form of mathematical expressions. Detailed algorithms in practical applications are also provided. Fractal measurement, error analysis and fractal description of cluster growth, thin films and surfaces are emphasized in this book. Image-Based Fractal Description of Microstructures provides a comprehensive approach to materials characterization by fractal from theory to application.
