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Joy Scott | Akateeminen Kirjakauppa

Haullasi löytyi yhteensä 16 tuotetta
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Scanning Electron Microscopy and X-Ray Microanalysis
Joseph I. Goldstein; Dale E. Newbury; Joseph R. Michael; Nicholas W.M. Ritchie; John Henry J. Scott; David C. Joy
Springer-Verlag New York Inc. (2017)
Kovakantinen kirja
107,50
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ostoskoriin kpl
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Scanning Electron Microscopy and X-Ray Microanalysis
Joseph I. Goldstein; Dale E. Newbury; Joseph R. Michael; Nicholas W.M. Ritchie; John Henry J. Scott; David C. Joy
Springer-Verlag New York Inc. (2018)
Pehmeäkantinen kirja
97,90
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ostoskoriin kpl
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Family Life
Renae Joy Scott
Xlibris (2013)
Pehmeäkantinen kirja
32,40
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ostoskoriin kpl
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Family Life
Renae Joy Scott
Xlibris (2013)
Kovakantinen kirja
63,50
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ostoskoriin kpl
Siirry koriin
Do You Love God?
Scott-Branagan; Bronwen Joy
Touchladybirdlucky Studios (2018)
Pehmeäkantinen kirja
9,90
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ostoskoriin kpl
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St. Paul's Letter to the Celts
Scott-Branagan; Bronwen Joy
LIGHTNING SOURCE INC (2016)
Pehmeäkantinen kirja
12,30
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Siirry koriin
Joan: Sunshine and Shadows
Scott-Branagan; Bronwen Joy
LIGHTNING SOURCE INC (2016)
Pehmeäkantinen kirja
10,10
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Running The Long Race In Gifted Education: Narratives and Interviews from Culturally Diverse Gifted Adults
Joy M Scott-Carrol; Anthony Sparks
LIGHTNING SOURCE INC (2016)
Pehmeäkantinen kirja
60,80
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My Little Book of Daily Prayers
Scott-Branagan Bronwen Scott-Branagan; Scott-Branagan Bronwen Joy Scott-Branagan
Independently published (2021)
Pehmeäkantinen kirja
11,20
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Macmillan Caribbean Writers You Can Lead a Horse to Water
Judy Stone; Joy Scott; Godfrey Sealy; D Gail Saunders
Macmillan Education (2005)
Pehmeäkantinen kirja
9,80
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Introducing Theatre
Joy Reilly; M. Scott Phillips
Pearson Education (US) (2024)
Pehmeäkantinen kirja
69,90
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Gumbo for the Soul - Liberating Memoirs and Stories to Inspire Females of Color
Donna Y. Ford; Joy Lawson Davis; Michelle Trotman Scott; Yolanda Sealey-Ruiz
Information Age Publishing (2016)
Kovakantinen kirja
63,30
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Gumbo for the Soul - Liberating Memoirs and Stories to Inspire Females of Color
Donna Y. Ford; Joy Lawson Davis; Michelle Trotman Scott; Yolanda Sealey-Ruiz
Information Age Publishing (2016)
Pehmeäkantinen kirja
41,90
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Talking Back to Purity Culture – Rediscovering Faithful Christian Sexuality
Rachel Joy Welcher; Scott Sauls
InterVarsity Press (2020)
Pehmeäkantinen kirja
19,00
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The Palgrave Handbook of Disability and Communication
Michael S. Jeffress; Joy M. Cypher; Jim Ferris; Julie-Ann Scott-Pollock
Springer International Publishing AG (2023)
Kovakantinen kirja
172,80
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The Palgrave Handbook of Disability and Communication
Michael S. Jeffress; Joy M. Cypher; Jim Ferris; Julie-Ann Scott-Pollock
Springer International Publishing AG (2024)
Pehmeäkantinen kirja
172,80
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Scanning Electron Microscopy and X-Ray Microanalysis
107,50 €
Springer-Verlag New York Inc.
Sivumäärä: 550 sivua
Asu: Kovakantinen kirja
Painos: 4th ed. 2018
Julkaisuvuosi: 2017, 18.11.2017 (lisätietoa)
Kieli: Englanti
This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysis (EBSD) for micro-crystallography, and focused ion beams. Students and academic researchers will find the text to be an authoritative and scholarly resource, while SEM operators and a diversity of practitioners — engineers, technicians, physical and biological scientists, clinicians, and technical managers — will find that every chapter has been overhauled to meet the more practical needs of the technologist and working professional. In a break with the past, this Fourth Edition de-emphasizes the design and physical operating basis of the instrumentation, including the electron sources, lenses, detectors, etc. In the modern SEM, many of the low level instrument parameters are now controlled and optimized by the microscope’s software, and user access is restricted. Although the software control system provides efficient and reproducible microscopy and microanalysis, the user must understand the parameter space wherein choices are made to achieve effective and meaningful microscopy, microanalysis, and micro-crystallography. Therefore, special emphasis is placed on beam energy, beam current, electron detector characteristics and controls, and ancillary techniques such as energy dispersive x-ray spectrometry (EDS) and electron backscatter diffraction (EBSD).
With 13 years between the publication of the third and fourth editions, new coverage reflects the many improvements in the instrument and analysis techniques. The SEM has evolved into a powerful and versatile characterization platform in which morphology, elemental composition, and crystal structure can be evaluated simultaneously. Extension of the SEM into a "dual beam" platform incorporating bothelectron and ion columns allows precision modification of the specimen by focused ion beam milling. New coverage in the Fourth Edition includes the increasing use of field emission guns and SEM instruments with high resolution capabilities, variable pressure SEM operation, theory, and measurement of x-rays with high throughput silicon drift detector (SDD-EDS) x-ray spectrometers. In addition to powerful vendor- supplied software to support data collection and processing, the microscopist can access advanced capabilities available in free, open source software platforms, including the National Institutes of Health (NIH) ImageJ-Fiji for image processing and the National Institute of Standards and Technology (NIST) DTSA II for quantitative EDS x-ray microanalysis and spectral simulation, both of which are extensively used in this work. However, the user has a responsibility to bring intellect, curiosity, and a proper skepticism to information on a computer screen and to the entire measurement process. This book helps you to achieve this goal.

Realigns the text with the needs of a diverse audience from researchers and graduate students to SEM operators and technical managers

Emphasizes practical, hands-on operation of the microscope, particularly user selection of the critical operating parameters to achieve meaningful results

Provides step-by-step overviews of SEM, EDS, and EBSD and checklists of critical issues for SEM imaging, EDS x-ray microanalysis, and EBSD crystallographic measurements

Makes extensive use of open source software: NIH ImageJ-FIJI for image processing and NIST DTSA II for quantitative EDS x-ray microanalysis and EDS spectral simulation.

Includes case studies to illustrate practical problem solving

Covers Helium ion scanning microscopy

Organized into relatively self-contained modules – no need to "read it all" to understand a topic

Includesan online supplement—an extensive "Database of Electron–Solid Interactions"—which can be accessed on SpringerLink, in Chapter 3

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Tilaustuote | Arvioimme, että tuote lähetetään meiltä noin 4-5 viikossa | Tilaa jouluksi viimeistään 27.11.2024
Myymäläsaatavuus
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Tapiola
Turku
Tampere
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ISBN:
9781493966745
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