Tekijä: Johan Liu; Olli Salmela; Jussi Sarkka; James E. Morris; Per-Erik Tegehall; Cristina Andersson Kustantaja: Springer-Verlag New York Inc. (2011) Saatavuus: Noin 16-19 arkipäivää
Tekijä: Johan Liu; Olli Salmela; Jussi Sarkka; James E. Morris; Per-Erik Tegehall; Cristina Andersson Kustantaja: Springer-Verlag New York Inc. (2014) Saatavuus: Noin 16-19 arkipäivää
Tekijä: Liu Xiaobo; Anna Gustafsson Chen (övers.); Fredrik Fällman (övers.); Perry Johansson (övers.); Gunnel Nornholm (övers.) Kustantaja: Weyler Förlag (2011) Saatavuus: Loppuunmyyty.
Tekijä: Kai Shu; Huan Liu; Jiawei Han; Lise Getoor; Wei Wang; Johannes Gehrke; Robert Grossman Kustantaja: Morgan & Claypool Publishers (2019) Saatavuus: 1-3 viikkoa
Tekijä: Kai Shu; Huan Liu; Jiawei Han; Lise Getoor; Wei Wang; Johannes Gehrke; Robert Grossman Kustantaja: Morgan & Claypool Publishers (2019) Saatavuus: 1-3 viikkoa
Reliability of Microtechnology discusses the reliability of microtechnology products from the bottom up, beginning with devices and extending to systems. The book's focus includes but is not limited to reliability issues of interconnects, the methodology of reliability concepts and general failure mechanisms. Specific failure modes in solder and conductive adhesives are discussed at great length. Coverage of accelerated testing, component and system level reliability, and reliability design for manufacturability are also described in detail.
The book also includes exercises and detailed solutions at the end of each chapter.