Tekijä: Marc De Graef (ed.); Henning Friis Poulsen (ed.); Alexis Lewis (ed.); Jeff Simmons (ed.); George Spanos (ed.) Kustantaja: Springer (2016) Saatavuus: Noin 17-20 arkipäivää
Tekijä: Marc De Graef (ed.); Henning Friis Poulsen (ed.); Alexis Lewis (ed.); Jeff Simmons (ed.); George Spanos (ed.) Kustantaja: Springer (2018) Saatavuus: Noin 17-20 arkipäivää
EUR 97,90
Three-Dimensional X-Ray Diffraction Microscopy - Mapping Polycrystals and their Dynamics
Three-dimensional x-ray diffraction (3DXRD) microscopy is a novel experimental method for structural characterisation of polycrystalline materials. The position, morphology, phase, strain and crystallographic orientation of hundreds of grains or sub-grain embedded within mm-cm thick specimens can be determined simultaneously. Furthermore, the dynamics of the individual structural elements can be monitored during typical processes such as deformation or annealing.
The book gives a comprehensive account of the methodology followed by a summary of selected applications. The method is presented from a mathematical/crystallographic point-of-view but with sufficient hands-on details to enable the reader to plan his or her own experiments. The scope of applications includes work in materials science and engineering, geophysics, geology, chemistry and pharmaceutical science.
