Tekijä: Terje Dokland; Dietmar Werner Hutmacher; Mary Mah-lee Ng; Jan-thorsten Schantz; Connie Poh Nee Er Kustantaja: World Scientific Publishing Co Pte Ltd (2006) Saatavuus: Noin 12-15 arkipäivää
Tekijä: Ernst Meyer; Hans Josef Hug; Roland Bennewitz Kustantaja: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG (2003) Saatavuus: Noin 17-20 arkipäivää
Taylor & Francis Ltd Sivumäärä: 264 sivua Asu: Pehmeäkantinen kirja Painos: 3rd edition Julkaisuvuosi: 2000, 30.11.2000 (lisätietoa) Kieli: Englanti
Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been rapid changes in this field since then. The authors have vastly updated their very successful second edition, which is already established as an essential laboratory manual worldwide, and they have incorporated questions and answers in each chapter for ease of learning. Equally as relevant for material scientists and bioscientists, this third edition is an essential textbook.