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David J. Goldstein | Akateeminen Kirjakauppa

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Scanning Electron Microscopy and X-Ray Microanalysis
Joseph I. Goldstein; Dale E. Newbury; Joseph R. Michael; Nicholas W.M. Ritchie; John Henry J. Scott; David C. Joy
Springer-Verlag New York Inc. (2017)
Kovakantinen kirja
107,50
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ostoskoriin kpl
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Scanning Electron Microscopy and X-Ray Microanalysis
Joseph I. Goldstein; Dale E. Newbury; Joseph R. Michael; Nicholas W.M. Ritchie; John Henry J. Scott; David C. Joy
Springer-Verlag New York Inc. (2018)
Pehmeäkantinen kirja
97,90
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ostoskoriin kpl
Siirry koriin
The Management of Eating Disorders and Obesity
David J. Goldstein
Humana Press Inc. (2004)
Kovakantinen kirja
190,00
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ostoskoriin kpl
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The Management of Eating Disorders and Obesity
David J. Goldstein (ed.)
Humana (2010)
Pehmeäkantinen kirja
190,00
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ostoskoriin kpl
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Handbook of Otolaryngology - Head and Neck Surgery
David Goldenberg; Bradley J. Goldstein
MM - Thieme (2017)
Pehmeäkantinen kirja
109,90
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Scanning Electron Microscopy and X-Ray Microanalysis : Third Edition
Joseph Goldstein; Dale E. Newbury; David C. Joy; Charles E. Lyman; Patrick Echlin; Eric Lifshin; Linda Sawyer; J Michael
Springer (2003)
Kovakantinen kirja
107,50
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ostoskoriin kpl
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Finite Mathematics&Its Applications, Books a la Carte Edition
Larry J. Goldstein; David I. Schneider; Martha J. Siegel
Prentice Hall (2009)
Liukusidottu kirja
184,20
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Calculus&Its Applications
Larry J. Goldstein; David I. Schneider; David C. Lay
Prentice Hall (2009)
Liukusidottu kirja
185,70
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ostoskoriin kpl
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Brief Calculus&Its Applications, Books a la Carte Edition
Larry J. Goldstein; David I. Schneider; David C. Lay
ADDISON WESLEY PUB CO INC (2009)
Liukusidottu kirja
180,30
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Calculus&Its Applications, Books a la Carte Plus Mathxl 12-Month Student Access Kit
Larry J. Goldstein; David I. Schneider; David C. Lay
Prentice Hall (2009)
Kovakantinen kirja
200,40
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ostoskoriin kpl
Siirry koriin
Finite Mathematics&Its Applications, Books a la Carte Plus Mymathlab/Mystatlab Student Access Kit
Larry J. Goldstein; David I. Schneider; Martha J. Siegel
Prentice Hall (2009)
Kovakantinen kirja
200,40
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ostoskoriin kpl
Siirry koriin
Brief Calculus and Its Applications Plus Mymathlab/Mystatlab Student Access Code Card
Larry J. Goldstein; David I. Schneider; David C. Lay
Prentice Hall (2010)
Kovakantinen kirja
282,80
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Finite Mathematics&Its Applications [With Access Code]
Larry J. Goldstein; David I. Schneider
Prentice Hall (2010)
Kovakantinen kirja
290,90
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Albanese V. Pierce U.S. Supreme Court Transcript of Record with Supporting Pleadings
David Goldstein; J Warren Upson
Gale, U.S. Supreme Court Records (2011)
Pehmeäkantinen kirja
64,00
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Jere N. Helfat, Petitioner, V. Securities and Exchange Commission et al. U.S. Supreme Court Transcript of Record with Supporting
Burton J Goldstein; David Ferber
Gale Ecco, U.S. Supreme Court Records (2011)
Pehmeäkantinen kirja
67,70
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Finite Mathematics&Its Applications with Student Solutions Manual
Larry J. Goldstein; David I. Schneider; Martha J. Siegel
ADDISON WESLEY PUB CO INC (2009)
Pehmeäkantinen kirja
280,20
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ostoskoriin kpl
Siirry koriin
Brief Calculus&Its Applications with Student Solutions Manual
Larry J. Goldstein; David I. Schneider; David C. Lay
ADDISON WESLEY PUB CO INC (2009)
Pehmeäkantinen kirja
271,20
Tuotetta lisätty
ostoskoriin kpl
Siirry koriin
Brief Calculus&Its Applications with Student Solutions Manual and Mymathlab
Larry J. Goldstein; David I. Schneider; David C. Lay
ADDISON WESLEY PUB CO INC (2009)
Pehmeäkantinen kirja
290,30
Tuotetta lisätty
ostoskoriin kpl
Siirry koriin
Calculus and Its Applications with Student Solutions Manual
Larry J. Goldstein; David I. Schneider; David C. Lay
ADDISON WESLEY PUB CO INC (2009)
Pehmeäkantinen kirja
277,10
Tuotetta lisätty
ostoskoriin kpl
Siirry koriin
Finite Mathematics&Its Applications with Student Solutions Manual and Mymathlab
Larry J. Goldstein; David I. Schneider; Martha J. Siegel
ADDISON WESLEY PUB CO INC (2009)
Pehmeäkantinen kirja
293,30
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Scanning Electron Microscopy and X-Ray Microanalysis
107,50 €
Springer-Verlag New York Inc.
Sivumäärä: 550 sivua
Asu: Kovakantinen kirja
Painos: 4th ed. 2018
Julkaisuvuosi: 2017, 18.11.2017 (lisätietoa)
Kieli: Englanti
This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysis (EBSD) for micro-crystallography, and focused ion beams. Students and academic researchers will find the text to be an authoritative and scholarly resource, while SEM operators and a diversity of practitioners — engineers, technicians, physical and biological scientists, clinicians, and technical managers — will find that every chapter has been overhauled to meet the more practical needs of the technologist and working professional. In a break with the past, this Fourth Edition de-emphasizes the design and physical operating basis of the instrumentation, including the electron sources, lenses, detectors, etc. In the modern SEM, many of the low level instrument parameters are now controlled and optimized by the microscope’s software, and user access is restricted. Although the software control system provides efficient and reproducible microscopy and microanalysis, the user must understand the parameter space wherein choices are made to achieve effective and meaningful microscopy, microanalysis, and micro-crystallography. Therefore, special emphasis is placed on beam energy, beam current, electron detector characteristics and controls, and ancillary techniques such as energy dispersive x-ray spectrometry (EDS) and electron backscatter diffraction (EBSD).
With 13 years between the publication of the third and fourth editions, new coverage reflects the many improvements in the instrument and analysis techniques. The SEM has evolved into a powerful and versatile characterization platform in which morphology, elemental composition, and crystal structure can be evaluated simultaneously. Extension of the SEM into a "dual beam" platform incorporating bothelectron and ion columns allows precision modification of the specimen by focused ion beam milling. New coverage in the Fourth Edition includes the increasing use of field emission guns and SEM instruments with high resolution capabilities, variable pressure SEM operation, theory, and measurement of x-rays with high throughput silicon drift detector (SDD-EDS) x-ray spectrometers. In addition to powerful vendor- supplied software to support data collection and processing, the microscopist can access advanced capabilities available in free, open source software platforms, including the National Institutes of Health (NIH) ImageJ-Fiji for image processing and the National Institute of Standards and Technology (NIST) DTSA II for quantitative EDS x-ray microanalysis and spectral simulation, both of which are extensively used in this work. However, the user has a responsibility to bring intellect, curiosity, and a proper skepticism to information on a computer screen and to the entire measurement process. This book helps you to achieve this goal.

Realigns the text with the needs of a diverse audience from researchers and graduate students to SEM operators and technical managers

Emphasizes practical, hands-on operation of the microscope, particularly user selection of the critical operating parameters to achieve meaningful results

Provides step-by-step overviews of SEM, EDS, and EBSD and checklists of critical issues for SEM imaging, EDS x-ray microanalysis, and EBSD crystallographic measurements

Makes extensive use of open source software: NIH ImageJ-FIJI for image processing and NIST DTSA II for quantitative EDS x-ray microanalysis and EDS spectral simulation.

Includes case studies to illustrate practical problem solving

Covers Helium ion scanning microscopy

Organized into relatively self-contained modules – no need to "read it all" to understand a topic

Includesan online supplement—an extensive "Database of Electron–Solid Interactions"—which can be accessed on SpringerLink, in Chapter 3

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Tilaustuote | Arvioimme, että tuote lähetetään meiltä noin 4-5 viikossa | Tilaa jouluksi viimeistään 27.11.2024
Myymäläsaatavuus
Helsinki
Tapiola
Turku
Tampere
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ISBN:
9781493966745
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