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C. W. Dale | Akateeminen Kirjakauppa

Haullasi löytyi yhteensä 43 tuotetta
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Scanning Electron Microscopy and X-Ray Microanalysis
Joseph I. Goldstein; Dale E. Newbury; Joseph R. Michael; Nicholas W.M. Ritchie; John Henry J. Scott; David C. Joy
Springer-Verlag New York Inc. (2017)
Kovakantinen kirja
107,50
Tuotetta lisätty
ostoskoriin kpl
Siirry koriin
Scanning Electron Microscopy and X-Ray Microanalysis
Joseph I. Goldstein; Dale E. Newbury; Joseph R. Michael; Nicholas W.M. Ritchie; John Henry J. Scott; David C. Joy
Springer-Verlag New York Inc. (2018)
Pehmeäkantinen kirja
97,90
Tuotetta lisätty
ostoskoriin kpl
Siirry koriin
The Living Christ and the Four Gospels
R W Dale; C Armstrong and Son A C Armstrong and Son; A C Armstrong and Son
BiblioLife (2010)
Kovakantinen kirja
84,70
Tuotetta lisätty
ostoskoriin kpl
Siirry koriin
Project CHECO Southeast Asia Study - Interdiction in Southeast Asia, November 1966 - October 1968
C. W. Thorndale; HQ PACAF Project CHECO
Books Express Publishing (2012)
Pehmeäkantinen kirja
44,30
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ostoskoriin kpl
Siirry koriin
Maintaining financial stability in an open economy : Sweden in the global crisis and beyond
Ralph C. Bryant; Dale W. Henderson; Torbjörn Becker
SNS Förlag (2012)
Pehmeäkantinen kirja
30,10
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ostoskoriin kpl
Siirry koriin
The Living Christ and the Four Gospels
R W Dale; C Armstrong and Son A C Armstrong and Son; A C Armstrong and Son
BiblioLife (2010)
Pehmeäkantinen kirja
61,10
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ostoskoriin kpl
Siirry koriin
The History of Glanville's Wootton, in the County of Dorset - Including Its Zoology and Botany (Classic Reprint)
C W Dale
Forgotten Books (2016)
Pehmeäkantinen kirja
52,70
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ostoskoriin kpl
Siirry koriin
Butter and Cheese (Classic Reprint)
C. W. Walker Tisdale
LULU PR (2018)
Pehmeäkantinen kirja
36,90
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ostoskoriin kpl
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The History of Glanville's Wootton, in the County of Dorset: Including Its Zoology and Botany (Classic Reprint)
C. W. Dale
FB&C LTD (2018)
Kovakantinen kirja
70,00
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ostoskoriin kpl
Siirry koriin
The Mechanical Properties Of Fluids
C V Drysdale and F R W Hunt
Creative Media Partners, LLC (2021)
Pehmeäkantinen kirja
33,60
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ostoskoriin kpl
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The Party Train - A Collection of North American Prose Poetry
Robert Alexander; C.W. Truesdale; Mark Vinz
New Rivers Press (1996)
Pehmeäkantinen kirja
53,60
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ostoskoriin kpl
Siirry koriin
Matthew 1-7 - Volume 1
W. D. Davies; Allison, Jr., Dale C.
Bloomsbury Publishing PLC (2004)
Pehmeäkantinen kirja
65,70
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ostoskoriin kpl
Siirry koriin
Matthew 8-18 - Volume 2
W. D. Davies; Allison, Jr., Dale C.
Bloomsbury Publishing PLC (2004)
Pehmeäkantinen kirja
65,70
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ostoskoriin kpl
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Matthew 19-28 - Volume 3
W. D. Davies; Allison, Jr., Dale C.
Bloomsbury Publishing PLC (2004)
Pehmeäkantinen kirja
65,70
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ostoskoriin kpl
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Matthew - A Shorter Commentary
W. D. Davies; Allison, Jr., Dale C.
Bloomsbury Publishing PLC (2005)
Pehmeäkantinen kirja
65,00
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ostoskoriin kpl
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Antitrust and Agriculture
Dale C Dahl; Winston W Grant
University Press of the Pacific (2005)
Pehmeäkantinen kirja
16,10
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ostoskoriin kpl
Siirry koriin
Practical Buttermaking: A Treatise for Buttermakers and Students (1919)
C. W. Walker-Tisdale; Theodore R. Robinson
KESSINGER PUB CO (2007)
Pehmeäkantinen kirja
28,00
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ostoskoriin kpl
Siirry koriin
Practical Buttermaking: A Treatise for Buttermakers and Students (1919)
C. W. Walker-Tisdale; Theodore R. Robinson
KESSINGER PUB CO (2008)
Kovakantinen kirja
73,40
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ostoskoriin kpl
Siirry koriin
Radical Banach Algebras and Automatic Continuity - Proceedings of a Conference Held at California State University Long Beach, J
J.M. Bachar; W.G. Bade; P.C. Jr. Curtis; H.G. Dales; M.P. Thomas
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG (1983)
Pehmeäkantinen kirja
44,70
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Scanning Electron Microscopy and X-Ray Microanalysis
107,50 €
Springer-Verlag New York Inc.
Sivumäärä: 550 sivua
Asu: Kovakantinen kirja
Painos: 4th ed. 2018
Julkaisuvuosi: 2017, 18.11.2017 (lisätietoa)
Kieli: Englanti
This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysis (EBSD) for micro-crystallography, and focused ion beams. Students and academic researchers will find the text to be an authoritative and scholarly resource, while SEM operators and a diversity of practitioners — engineers, technicians, physical and biological scientists, clinicians, and technical managers — will find that every chapter has been overhauled to meet the more practical needs of the technologist and working professional. In a break with the past, this Fourth Edition de-emphasizes the design and physical operating basis of the instrumentation, including the electron sources, lenses, detectors, etc. In the modern SEM, many of the low level instrument parameters are now controlled and optimized by the microscope’s software, and user access is restricted. Although the software control system provides efficient and reproducible microscopy and microanalysis, the user must understand the parameter space wherein choices are made to achieve effective and meaningful microscopy, microanalysis, and micro-crystallography. Therefore, special emphasis is placed on beam energy, beam current, electron detector characteristics and controls, and ancillary techniques such as energy dispersive x-ray spectrometry (EDS) and electron backscatter diffraction (EBSD).
With 13 years between the publication of the third and fourth editions, new coverage reflects the many improvements in the instrument and analysis techniques. The SEM has evolved into a powerful and versatile characterization platform in which morphology, elemental composition, and crystal structure can be evaluated simultaneously. Extension of the SEM into a "dual beam" platform incorporating bothelectron and ion columns allows precision modification of the specimen by focused ion beam milling. New coverage in the Fourth Edition includes the increasing use of field emission guns and SEM instruments with high resolution capabilities, variable pressure SEM operation, theory, and measurement of x-rays with high throughput silicon drift detector (SDD-EDS) x-ray spectrometers. In addition to powerful vendor- supplied software to support data collection and processing, the microscopist can access advanced capabilities available in free, open source software platforms, including the National Institutes of Health (NIH) ImageJ-Fiji for image processing and the National Institute of Standards and Technology (NIST) DTSA II for quantitative EDS x-ray microanalysis and spectral simulation, both of which are extensively used in this work. However, the user has a responsibility to bring intellect, curiosity, and a proper skepticism to information on a computer screen and to the entire measurement process. This book helps you to achieve this goal.

Realigns the text with the needs of a diverse audience from researchers and graduate students to SEM operators and technical managers

Emphasizes practical, hands-on operation of the microscope, particularly user selection of the critical operating parameters to achieve meaningful results

Provides step-by-step overviews of SEM, EDS, and EBSD and checklists of critical issues for SEM imaging, EDS x-ray microanalysis, and EBSD crystallographic measurements

Makes extensive use of open source software: NIH ImageJ-FIJI for image processing and NIST DTSA II for quantitative EDS x-ray microanalysis and EDS spectral simulation.

Includes case studies to illustrate practical problem solving

Covers Helium ion scanning microscopy

Organized into relatively self-contained modules – no need to "read it all" to understand a topic

Includesan online supplement—an extensive "Database of Electron–Solid Interactions"—which can be accessed on SpringerLink, in Chapter 3

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Tilaustuote | Arvioimme, että tuote lähetetään meiltä noin 4-5 viikossa | Tilaa jouluksi viimeistään 27.11.2024
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Helsinki
Tapiola
Turku
Tampere
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ISBN:
9781493966745
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