SULJE VALIKKO

Englanninkielisten kirjojen poikkeusaikata... LUE LISÄÄ

avaa valikko

C. R. Scott | Akateeminen Kirjakauppa

Haullasi löytyi yhteensä 61 tuotetta
Haluatko tarkentaa hakukriteerejä?



Scanning Electron Microscopy and X-Ray Microanalysis
Joseph I. Goldstein; Dale E. Newbury; Joseph R. Michael; Nicholas W.M. Ritchie; John Henry J. Scott; David C. Joy
Springer-Verlag New York Inc. (2017)
Kovakantinen kirja
107,50
Tuotetta lisätty
ostoskoriin kpl
Siirry koriin
Scanning Electron Microscopy and X-Ray Microanalysis
Joseph I. Goldstein; Dale E. Newbury; Joseph R. Michael; Nicholas W.M. Ritchie; John Henry J. Scott; David C. Joy
Springer-Verlag New York Inc. (2018)
Pehmeäkantinen kirja
97,90
Tuotetta lisätty
ostoskoriin kpl
Siirry koriin
No Excuse, No Denial
Derek C Davis; Scott R Davis
iUniverse (2000)
Pehmeäkantinen kirja
17,00
Tuotetta lisätty
ostoskoriin kpl
Siirry koriin
Accounting for Fundamentalisms - The Dynamic Character of Movements
Martin E. Marty; R. Scott Appleby; Nancy T. Ammerman; Robert Eric Frykenberg; Samuel C. Heilman; James Piscatori
The University of Chicago Press (2004)
Pehmeäkantinen kirja
70,20
Tuotetta lisätty
ostoskoriin kpl
Siirry koriin
Parables of Redemption: The Restored Doctrine of the Atonement as Taught in the Parables of Jesus Christ
Andrew C. Skinner; R. Scott Burton; Craig Frogley
Cedar Fort (2007)
Pehmeäkantinen kirja
36,10
Tuotetta lisätty
ostoskoriin kpl
Siirry koriin
The Social Psychology of Politics
Victor C. Ottati; R. Scott Tindale; John Edwards; Fred B. Bryant; Linda Heath; Yolanda Suarez-Balcazar; Emil J. Posavac
Springer Science+Business Media (2002)
Kovakantinen kirja
97,90
Tuotetta lisätty
ostoskoriin kpl
Siirry koriin
Analyzing the Labor Force - Concepts, Measures, and Trends
Clifford C. Clogg; Scott R. Eliason; Kevin T. Leicht
Springer Science+Business Media (2001)
Pehmeäkantinen kirja
49,60
Tuotetta lisätty
ostoskoriin kpl
Siirry koriin
Bringing Scanning Probe Microscopy up to Speed
Stephen C. Minne; Scott R. Manalis; Calvin F. Quate
Springer (1999)
Kovakantinen kirja
97,90
Tuotetta lisätty
ostoskoriin kpl
Siirry koriin
Methods of Quantitative Organic Analysis
P. C. R. Kingscott
Cambridge Scholars Publishing (2010)
Pehmeäkantinen kirja
63,30
Tuotetta lisätty
ostoskoriin kpl
Siirry koriin
The Social Psychology of Politics
Victor C. Ottati; R. Scott Tindale; John Edwards; Fred B. Bryant; Linda Heath; Yolanda Suarez-Balcazar; Emil J. Posavac
Springer-Verlag New York Inc. (2012)
Pehmeäkantinen kirja
107,50
Tuotetta lisätty
ostoskoriin kpl
Siirry koriin
Bringing Scanning Probe Microscopy up to Speed
Stephen C. Minne; Scott R. Manalis; Calvin F. Quate
Springer-Verlag New York Inc. (2013)
Pehmeäkantinen kirja
97,90
Tuotetta lisätty
ostoskoriin kpl
Siirry koriin
Forestry in the U.S. South - A History
Mason C. Carter; Robert C. Kellison; R. Scott Wallinger
Louisiana State University Press (2015)
Kovakantinen kirja
67,10
Tuotetta lisätty
ostoskoriin kpl
Siirry koriin
An Introduction to Soil Mechanics and Foundations
C. R. Scott
Springer (1994)
Pehmeäkantinen kirja
107,50
Tuotetta lisätty
ostoskoriin kpl
Siirry koriin
Methods of Quantitative Organic Analysis (Classic Reprint)
P C R Kingscott
Forgotten Books (2015)
Pehmeäkantinen kirja
47,20
Tuotetta lisätty
ostoskoriin kpl
Siirry koriin
Methods of Quantitative Organic Analysis
P C R Kingscott; R S G Knight
Creative Media Partners, LLC (2016)
Kovakantinen kirja
44,80
Tuotetta lisätty
ostoskoriin kpl
Siirry koriin
METHODS OF QUANTITATIVE ORGANI
P C R Kingscott; R S G Knight
WENTWORTH PR (2016)
Kovakantinen kirja
81,50
Tuotetta lisätty
ostoskoriin kpl
Siirry koriin
The Operations of Aural Surgery, Together with Those for the Relief of the Intracranial Complications of Suppurative Otitis Medi
C Ernest West; Sydney R Scott
Trieste Publishing (2018)
Pehmeäkantinen kirja
54,50
Tuotetta lisätty
ostoskoriin kpl
Siirry koriin
On Being Reformed - Debates over a Theological Identity
Matthew C. Bingham; Chris Caughey; R. Scott Clark; Crawford Gribben; D. G. Hart
Birkhauser Verlag AG (2018)
Kovakantinen kirja
68,90
Tuotetta lisätty
ostoskoriin kpl
Siirry koriin
Home Labor Saving Devices
Rhea C Scott; Mrs R E Gamble
Trieste Publishing (2018)
Pehmeäkantinen kirja
43,60
Tuotetta lisätty
ostoskoriin kpl
Siirry koriin
Thomas Hardy
R.a.scott James; C. Day Lewis
Liverpool University Press (1965)
Pehmeäkantinen kirja
26,10
Tuotetta lisätty
ostoskoriin kpl
Siirry koriin
Scanning Electron Microscopy and X-Ray Microanalysis
107,50 €
Springer-Verlag New York Inc.
Sivumäärä: 550 sivua
Asu: Kovakantinen kirja
Painos: 4th ed. 2018
Julkaisuvuosi: 2017, 18.11.2017 (lisätietoa)
Kieli: Englanti
This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysis (EBSD) for micro-crystallography, and focused ion beams. Students and academic researchers will find the text to be an authoritative and scholarly resource, while SEM operators and a diversity of practitioners — engineers, technicians, physical and biological scientists, clinicians, and technical managers — will find that every chapter has been overhauled to meet the more practical needs of the technologist and working professional. In a break with the past, this Fourth Edition de-emphasizes the design and physical operating basis of the instrumentation, including the electron sources, lenses, detectors, etc. In the modern SEM, many of the low level instrument parameters are now controlled and optimized by the microscope’s software, and user access is restricted. Although the software control system provides efficient and reproducible microscopy and microanalysis, the user must understand the parameter space wherein choices are made to achieve effective and meaningful microscopy, microanalysis, and micro-crystallography. Therefore, special emphasis is placed on beam energy, beam current, electron detector characteristics and controls, and ancillary techniques such as energy dispersive x-ray spectrometry (EDS) and electron backscatter diffraction (EBSD).
With 13 years between the publication of the third and fourth editions, new coverage reflects the many improvements in the instrument and analysis techniques. The SEM has evolved into a powerful and versatile characterization platform in which morphology, elemental composition, and crystal structure can be evaluated simultaneously. Extension of the SEM into a "dual beam" platform incorporating bothelectron and ion columns allows precision modification of the specimen by focused ion beam milling. New coverage in the Fourth Edition includes the increasing use of field emission guns and SEM instruments with high resolution capabilities, variable pressure SEM operation, theory, and measurement of x-rays with high throughput silicon drift detector (SDD-EDS) x-ray spectrometers. In addition to powerful vendor- supplied software to support data collection and processing, the microscopist can access advanced capabilities available in free, open source software platforms, including the National Institutes of Health (NIH) ImageJ-Fiji for image processing and the National Institute of Standards and Technology (NIST) DTSA II for quantitative EDS x-ray microanalysis and spectral simulation, both of which are extensively used in this work. However, the user has a responsibility to bring intellect, curiosity, and a proper skepticism to information on a computer screen and to the entire measurement process. This book helps you to achieve this goal.

Realigns the text with the needs of a diverse audience from researchers and graduate students to SEM operators and technical managers

Emphasizes practical, hands-on operation of the microscope, particularly user selection of the critical operating parameters to achieve meaningful results

Provides step-by-step overviews of SEM, EDS, and EBSD and checklists of critical issues for SEM imaging, EDS x-ray microanalysis, and EBSD crystallographic measurements

Makes extensive use of open source software: NIH ImageJ-FIJI for image processing and NIST DTSA II for quantitative EDS x-ray microanalysis and EDS spectral simulation.

Includes case studies to illustrate practical problem solving

Covers Helium ion scanning microscopy

Organized into relatively self-contained modules – no need to "read it all" to understand a topic

Includesan online supplement—an extensive "Database of Electron–Solid Interactions"—which can be accessed on SpringerLink, in Chapter 3

Tuotetta lisätty
ostoskoriin kpl
Siirry koriin
LISÄÄ OSTOSKORIIN
Tilaustuote | Arvioimme, että tuote lähetetään meiltä noin 4-5 viikossa | Tilaa jouluksi viimeistään 27.11.2024
Myymäläsaatavuus
Helsinki
Tapiola
Turku
Tampere
Scanning Electron Microscopy and X-Ray Microanalysiszoom
Näytä kaikki tuotetiedot
ISBN:
9781493966745
Sisäänkirjautuminen
Kirjaudu sisään
Rekisteröityminen
Oma tili
Omat tiedot
Omat tilaukset
Omat laskut
Lisätietoja
Asiakaspalvelu
Tietoa verkkokaupasta
Toimitusehdot
Tietosuojaseloste