Stress-Induced Phenomena in Metallization : Eighth International Workshop on Stress-Induced Phenomena in Metallization, Zschech, Ehrenfried (ed.); Maex, Karen (ed.); Ho, Paul S. (ed.); Kawasaki, Hisao (ed.); Nakamura, Tomoji (ed.), American Institute of Physics

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Stress-Induced Phenomena in Metallization : Eighth International Workshop on Stress-Induced Phenomena in Metallization

Ehrenfried Zschech (ed.), Karen Maex (ed.), Paul S. Ho (ed.), Hisao Kawasaki (ed.), Tomoji Nakamura (ed.)

159,90 €

American Institute of Physics
Sivumäärä: 372 sivua
Asu: Kovakantinen kirja
Painos: 2006
Julkaisuvuosi: 2006, 16.02.2006 (lisätietoa)
Kieli: Englanti
Tuotesarja: AIP Conference Proceedings Stress-Induced Phenomena Metallizat.

These proceedings present current research on issues related to stress-induced phenomena in on-chip metal interconnects and solder joints. The volume will appeal to scientists, engineers, graduate students interested in research and development of microelectronic devices as well as technology integration, and semiconductor industry professionals and equipment suppliers.

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