Structural, Syntactic, and Statistical Pattern Recognition : Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Ko, Yeung, Dit-Yan (ed.); Kwok, James T. (ed.); Fred, Ana (ed.); Roli, Fabio (ed.); de Ridder, Dick (ed.), Springer

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Structural, Syntactic, and Statistical Pattern Recognition : Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Ko

Dit-Yan Yeung (ed.), James T. Kwok (ed.), Ana Fred (ed.), Fabio Roli (ed.), Dick de Ridder (ed.)

97,90 €

Springer
Sivumäärä: 939 sivua
Asu: Pehmeäkantinen kirja
Julkaisuvuosi: 2006, 03.08.2006 (lisätietoa)
Kieli: Englanti
Tuotesarja: Image Processing, Computer Vision, Pattern Recognition, and Graphics

This is the proceedings of the 11th International Workshop on Structural and Syntactic Pattern Recognition, SSPR 2006 and the 6th International Workshop on Statistical Techniques in Pattern Recognition, SPR 2006, held in Hong Kong, August 2006 alongside the Conference on Pattern Recognition, ICPR 2006. 38 revised full papers and 61 revised poster papers are included, together with 4 invited papers covering image analysis, character recognition, bayesian networks, graph-based methods and more.

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