Self-Trapped Excitons discusses the structure and evolution of the self-trapped exciton (STE) in a wide range of materials. It includes a comprehensive review of experiments and extensive tables of data. Emphasis is given throughout to the unity of the basic physics underlying various manifestations of self-trapping, with the theory being developed from a localized, atomistic perspective. The topics treated in detail in relation to STE relaxation include spontaneous symmetry breaking, lattice defect formation, radiation damage, and electronic sputtering.

Foreword by: Y. Toyozawa