The book is a comprehensive guide to ESD (electrostatic discharge) protection and input/output design. Addressing the growing demand in industry for high-speed I/O designs, it bridges the gap between ESD research and current VLSI design practices, and serves as a reference for practicing engineers. The book presents an integrated treatment of ESD, I/O, and process parameter interactions that both I/O designers and process designers can use. It examines key factors in I/O and ESD design and testing, and focuses on design principles that can be applied widely as the field continues to evolve.