Scanning Tunneling Microscopy/Spectroscopy and Related Techniques : 12th International Conference, STM'03, Koenraad, P.M. (ed.); Kemerink, M. (ed.), American Institute of Physics

KIRJAUDU

ostoskori

avaa valikko

Scanning Tunneling Microscopy/Spectroscopy and Related Techniques : 12th International Conference, STM'03

P.M. Koenraad (ed.), M. Kemerink (ed.)

117,10 €

American Institute of Physics
Sivumäärä: 179 sivua
Asu: Moniviestin
Painos: 2003
Julkaisuvuosi: 2003, 19.12.2003 (lisätietoa)
Kieli: Englanti

At this conference the latest developments in the design, construction, and application of scanning probe microscopy like Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM), Magnetic Force Microscopy (MFM), Scanning Near-Field Optical Microscopy (SNOM) in the fields of nanotechnology, physics, chemistry, and biology were discussed.

Loppuunmyyty

Myymäläsaatavuus