PWithin the last 30 years, electron energy-loss spectroscopy has become a standard analytical technique used in the transmission electron microscope to extract chemical and structural information down to the atomic level. EMElectron Energy-Loss Spectroscopy in the Electron Microscope/EM has become the standard reference guide describing the instrumentation, physics, and procedures involved and the kind of results obtainable. /PP/PPWithin the last few years, lens-aberration correctors and electron-beam monochromators have become commercially available and have further increased the spatial and energy resolution of EELS. The third edition will include these new developments, as well as advances in electron-scattering theory, spectral and image processing, and recent applications in fields such as nanotechnology./P TOC:PChapter 1: An Introduction to Electron Energy-Loss Spectroscopy/PPChapter 2: Instrumentation for EELS/PPChapter 3: Physics of Electron Scattering/PPChapter 4: Quantitative Analysis of Energy-Loss Data/PPChapter 5: Applications/PPAppendices: Relativistic Bethe Theory, Computer programs, Tables of Plasmon and Edge energies, electron wavelengths etc./P