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Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications - 14th Iberoamerican Conference on Pattern Re
129,90 €
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Sivumäärä: 1082 sivua
Asu: Pehmeäkantinen kirja
Painos: 2009
Julkaisuvuosi: 2009, 26.10.2009 (lisätietoa)
Kieli: Englanti
Tuotesarja: Image Processing, Computer Vision, Pattern Recognition, and Graphics
The 14th Iberoamerican Congress on Pattern Recognition (CIARP 2009, C- gresoIberoAmericanodeReconocimientodePatrones)formedthelatestofanow longseriesofsuccessfulmeetingsarrangedbytherapidlygrowingIberoamerican pattern recognition community. The conference was held in Guadalajara, Jalisco, Mexico and organized by the Mexican Association for Computer Vision, Neural Computing and Robotics (MACVNR). It was sponsodred by MACVNR and ?ve other Iberoamerican PR societies. CIARP 2009 was like the previous conferences in the series supported by the International Association for Pattern Recognition (IAPR). CIARP 2009 attracted participants from all over the world presenting sta- of-the-artresearchon mathematical methods and computing techniques for p- tern recognition, computer vision, image and signal analysis, robot vision, and speech recognition, as well as on a wide range of their applications. This time the conference attracted participants from 23 countries,9 in Ibe- america, and 14 from other parts of the world. The total number of submitted papers was 187, and after a serious review process 108 papers were accepted, all of them with a scienti?c quality above overall mean rating. Sixty-four were selected as oral presentations and 44 as posters. Since 2008 the conference is almost single track, and therefore there was no real grading in quality between oral and poster papers. As an acknowledgment that CIARP has established itself as a high-quality conference, its proceedings appear in the Lecture Notes in Computer Science series. Moreover, its visibility is further enhanced by a selection of a set of papers that will be published in a special issue of the journal Pattern Recognition Letters.

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Helsinki
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Tampere
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