Gan-lin Zhang (ed.); Dick Brus (ed.); Feng Liu (ed.); Xiao-Dong Song (ed.); Philippe Lagacherie (ed.) Springer (2016) Saatavuus: Tilaustuote Kovakantinen kirja
Gan-lin Zhang (ed.); Dick Brus (ed.); Feng Liu (ed.); Xiao-Dong Song (ed.); Philippe Lagacherie (ed.) Springer (2019) Saatavuus: Tilaustuote Pehmeäkantinen kirja
Springer Sivumäärä: 367 sivua Asu: Pehmeäkantinen kirja Julkaisuvuosi: 2010, 01.12.2010 (lisätietoa) Kieli: Englanti
Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume I concentrates on the newly developed concepts and methods which are making TEM a powerful and indispensible tool in materials science.