Spherical Nanoindentation Stress-Strain Curves: Applications, Protocols and Data Analysis brings to light the recent advancements in data analysis protocols that have transformed indentation from being used merely as a qualitative tool for comparing materials to its more rigorous application for analyzing the stress-strain characteristics of materials.
This book collects and presents all of the important details of the key protocols, many of them recently developed, for the convenience of engineers and scientists in the materials manufacturing industry, OEMs, research laboratories, and academic institutions. Authors Kalidindi and Pathak explain the protocols used in generating indentation stress-strain curves and extracting meaningful properties from measured load-displacement data in spherical nanoindentation, also demystifying the use of nanoindentation as a material characterization tool that provides robust quantitative assessment of a material's mechanical properties.
Materials covered ranges from metals to biomaterials, and includes the use of new data analysis protocols to establish estimates of mechanical properties from the initial loading segment in the indentation experiments, the potential of characterizing the samples with indentation in conjunction with other structure quantification, techniques used to establish novel protocols for extracting new information needed to formulate material, constitutive laws at the lower length scales, the combined use of orientation imaging microscopy (OIM) and nanoindentation, the combined use of Raman spectroscopy and nanoindentation on bio-samples, and new insights into the buckling response in dense carbon nanotube (CNT) brushes.
- Provides datasets for a broad range of materials systems, ranging from metals to biological materials)
- Fully analyzes examples included, with details of the analysis steps
- Contains methods and protocols that are provided with enough detail for replication in the lab
- Includes important tips and guidance on how best to prepare samples for successful measurements
