Samuel A. Hevia | Akateeminen Kirjakauppa

This book covers fundamental microscopic techniques for Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM), Atomic Force Microscopy (AFM), and other microscopic tools.  It provides step-by-step instructions and explanations of the basic fundamental concepts and mechanisms and guides the reader on resolving queries related to taking and analyzing microscopy images. The latest advancements and developments in microscopic equipment are described. Theoretical background on microscopy is also provided to enhance the reader’s understanding of microscopy techniques and tools.

Microscopic Techniques for the Non-Expert is an ideal book for undergraduate and postgraduate students, as well as researchers with a background in environmental science, materials science, biomedicine, engineering, or bio-nanotechnology.