Nobuo Tanaka | Akateeminen Kirjakauppa

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SCANNING TRANSMISSION ELECTRON MICROSCOPY OF NANOMATERIALS: BASICS OF IMAGING AND ANALYSIS

Nobuo Tanaka
Imperial College Press (2014)
Kovakantinen kirja

237,10 €

$Electron Nano-Imaging : Basics of Imaging and Diffraction for TEM and STEM$

ELECTRON NANO-IMAGING : BASICS OF IMAGING AND DIFFRACTION FOR TEM AND STEM

Nobuo Tanaka
Springer (2017)
Kovakantinen kirja

91,40 €

$Electron Nano-Imaging - Basics of Imaging and Diffraction for TEM and STEM$

ELECTRON NANO-IMAGING - BASICS OF IMAGING AND DIFFRACTION FOR TEM AND STEM

Nobuo Tanaka
Springer Verlag, Japan (2018)
Pehmeäkantinen kirja

91,40 €

$Electron Nano-imaging - Basics of Imaging and Diffraction for TEM and STEM$

ELECTRON NANO-IMAGING - BASICS OF IMAGING AND DIFFRACTION FOR TEM AND STEM

Nobuo Tanaka
Springer Verlag, Japan (2024)
Kovakantinen kirja

101,40 €

MONOLITHIC SILICAS IN SEPARATION SCIENCE - CONCEPTS, SYNTHESES, CHARACTERIZATION, MODELING AND APPLICATIONS

Klaus K. Unger; Nobuo Tanaka; Egidijus Machtejevas
Wiley-VCH Verlag GmbH (2011)
Kovakantinen kirja

131,40 €

ADVANCES IN FLUID MODELING AND TURBULENCE MEASUREMENTS, PROCEEDINGS OF THE 8TH INTERNATIONAL SYMPOSIUM ON FLOW MODELING AND TURB

Nobu Mori; Hisashi Ninokata; Akira Wada; Nobuo Tanaka
World Scientific Publishing Co Pte Ltd (2002)
Kovakantinen kirja

338,80 €

Scanning Transmission Electron Microscopy Of Nanomaterials: Basics Of Imaging And Analysis

Nobuo Tanaka

237,10 €

Imperial College Press
Sivumäärä: 616 sivua
Asu: Kovakantinen kirja
Julkaisuvuosi: 2014, 13.10.2014 (lisätietoa)
Kieli: Englanti

The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.

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