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MODERN CHARACTERIZATION OF ELECTROMAGNETIC SYSTEMS AND ITS ASSOCIATED METROLOGY

Modern Characterization of Electromagnetic Systems and its Associated Metrology
Tapan K. Sarkar; Magdalena Salazar-Palma; Ming Da Zhu; Heng Chen
John Wiley & Sons Inc (2021)
Kovakantinen kirja
143,50
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Siirry koriin
Modern Characterization of Electromagnetic Systems and its Associated Metrology
143,50 €
John Wiley & Sons Inc
Sivumäärä: 720 sivua
Asu: Kovakantinen kirja
Julkaisuvuosi: 2021, 24.08.2021 (lisätietoa)
Kieli: Englanti
New method for the characterization of electromagnetic wave dynamics

Modern Characterization of Electromagnetic Systems introduces a new method of characterizing electromagnetic wave dynamics and measurements based on modern computational and digital signal processing techniques.  The techniques are described in terms of both principle and practice, so readers understand what they can achieve by utilizing them.

Additionally, modern signal processing algorithms are introduced in order to enhance the resolution and extract information from electromagnetic systems, including where it is not currently possible. For example, the author addresses the generation of non-minimum phase or transient response when given amplitude-only data.



Presents modern computational concepts in electromagnetic system characterization
Describes a solution to the generation of non-minimum phase from amplitude-only data
Covers model-based parameter estimation and planar near-field to far-field transformation as well as spherical near-field to far-field transformation

Modern Characterization of Electromagnetic Systems is ideal for graduate students, researchers, and professionals working in the area of antenna measurement and design. It introduces and explains a new process related to their work efforts and studies.

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Tilaustuote | Arvioimme, että tuote lähetetään meiltä noin 4-5 viikossa | Tilaa jouluksi viimeistään 27.11.2024
Myymäläsaatavuus
Helsinki
Tapiola
Turku
Tampere
Modern Characterization of Electromagnetic Systems and its Associated Metrologyzoom
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ISBN:
9781119076469
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