M. Muralidhar Singh | Akateeminen Kirjakauppa

The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. It explores the techniques implemented for advanced materials like superalloys, thin films, powders, nanocomposites, polymers, shape memory alloys, high entropy alloys, and so on. Major instruments covered include X-ray diffraction, near-field scanning optical microscopy Raman, X-ray photospectroscopy, ultraviolet-visible-near-infrared spectrosphotometer, Fourier-transform infrared spectroscopy, differential scanning calorimeter, profilometer, and thermogravimetric analysis.

Features:



Covers material characterization techniques and the development of advanced characterization technology
Includes multiple length scale characterization approaches for a large variety of materials, from nano- to micron-scale, as well as their constraints
Discusses advanced material characterization technology in the microstructural and property characterization fields
Reviews both practical and theoretical explanations of approaches for characterizing microstructure and properties
Offers fundamentals, basic instrumentation details, experimental approaches, analyses, and applications with case studies

This book is aimed at graduate students and researchers in materials science and engineering.