SULJE VALIKKO

avaa valikko

L. Inoccia | Akateeminen Kirjakauppa

EXAFS AND NEAR EDGE STRUCTURE - PROCEEDINGS OF THE INTERNATIONAL CONFERENCE FRASCATI, ITALY, SEPTEMBER 13–17, 1982

EXAFS and Near Edge Structure - Proceedings of the International Conference Frascati, Italy, September 13–17, 1982
A. Bianconi; L. Inoccia; S. Stipcich
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG (2012)
Pehmeäkantinen kirja
101,40
Tuotetta lisätty
ostoskoriin kpl
Siirry koriin
EXAFS and Near Edge Structure - Proceedings of the International Conference Frascati, Italy, September 13–17, 1982
101,40 €
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Sivumäärä: 422 sivua
Asu: Pehmeäkantinen kirja
Painos: Softcover reprint of
Julkaisuvuosi: 2012, 01.07.2012 (lisätietoa)
Kieli: Englanti
Tuotesarja: Springer Series in Chemical Physics 27
The field of X-ray spectroscopy using synchrotron radiation is growing so rapidly and expanding into such different research areas that it is now diffi­ cult to keep up with the literature. EXAFS and XANES are becoming interdis­ ciplinary methods used in solid-state physics, biology, and chemistry, and are making impressive contributions to these branches of science. The present book gives a panorama of the research activity in this field. It contains the papers presented at the International Conference on EXAFS and Near Edge Structure held in Frascati, Italy, September 13-17, 1982. This was the first international conference devoted to EXAFS spectroscopy (Extended X-ray Ab­ sorption Fine Structure) and its applications. The other topic of the con­ ference was the new XANES (X-ray Absorption Near Edge Structure), which in of experimental and theoretical developments finally appears to have terms left its infancy. The applications of EXAFS concern the determination of local structures in complex systems; we have therefore divided the subject matter into differ­ ent parts on various types of materials: amorphous metals, glasses, solu­ tions, biological systems, catalysts, and special crystals such as mixed valence systems and ionic conductors. EXAFS provides unique information for each kind of system, but the analysis of EXAFS data also poses special prob­ lems in each case. General problems of EXAFS data analysis are discussed, as well as developments in instrumentation for X-ray absorption using syn­ chrotron radiation and laboratory EXAFS.

Tuotetta lisätty
ostoskoriin kpl
Siirry koriin
LISÄÄ OSTOSKORIIN
Tilaustuote | Arvioimme, että tuote lähetetään meiltä noin 4-5 viikossa
Myymäläsaatavuus
Helsinki
Tapiola
Turku
Tampere
EXAFS and Near Edge Structure - Proceedings of the International Conference Frascati, Italy, September 13–17, 1982
Näytä kaikki tuotetiedot
ISBN:
9783642501005
Sisäänkirjautuminen
Kirjaudu sisään
Rekisteröityminen
Oma tili
Omat tiedot
Omat tilaukset
Omat laskut
Lisätietoja
Asiakaspalvelu
Tietoa verkkokaupasta
Toimitusehdot
Tietosuojaseloste