Hans Walter Wolff; Günter Menges; Jacob Marschak; Hellmut Salowsky; Bert Nagel; Hans-Ulrich Kolb; Joachim Telle; Binner Springer-Verlag Berlin and Heidelberg GmbH & Co. KG (1973) Saatavuus: Tilaustuote Pehmeäkantinen kirja
The AMDO 2000 workshop took place at the Universitat de les Illes Balears (UIB) on 7-9 September 2000, sponsored by the International Association for Pattern Recognition Technical Committee, the European Commission by - man Potential Program:High Level Scienti?c Conferences and the Mathematics andComputer Science DepartmentofUIB. Thesubject ofthe workshopwas- goingresearchinarticulatedmotiononthesequenceofimagesandsophisticated models for deformable objects. The goals of these areas are to understand and interpret object motion around complex objects that we can ?nd in sequences of images in the real world. These topics (geometry and physics of deformable models, motion analysis, articulated models and animation, visualization of - formable models, 3D recovery from motion, single or multiple human motion analysis and synthesis, applications of deformable models and motion analysis, etc. ) are interesting examples of how research can be used to solve more general problems. Another objective of this workshop was to relate ?elds using c- puter graphics, computer animation or applications in several disciplines c- bining synthetic and analytical images. In this regard it is of particular interest to encouragelinksbetweenresearchersinareasofcomputervisionandcomputer graphics who have common problems and frequently use similar techniques. The workshop included four sessions of presented papers and two tutorials. Invited speakers treating various aspects of the topics were: Y. Aloimonos from the Computer Vision Laboratory, Center for Automation Research, University of Maryland, USA, G. Medioni from the Institute for Robotics and Intelligent S- tems,UniversityofSouthernCalifornia,USA,andR. Boulic,Adjointscienti?que from the Swiss Federal Institute of Technology Lausanne, Switzerland. September 2000 H. -H. Nagel and F. J.