Elsevier Sivumäärä: 400 sivua Asu: Pehmeäkantinen kirja Julkaisuvuosi: 2025, 01.11.2025 (lisätietoa) Kieli: Englanti
Fundamentals of Microstructure Characterization of Materials covers a wide range of topics, methods, and fundamental information for the characterization of materials. Techniques discussed include spectroscopic ones such as electromagnetic radiation, X-ray photoelectron, atomic emission, and more. Scanning electron microscope techniques are outlined, as are sample preparation methods such as cutting, grinding and polishing, etching, and others. Microscopy fundamentals are discussed as well, with coverage of types of lenses, optical imaging formation principles, depth of field and depth of focus included. A full chapter is dedicated to statistical analysis, covering concepts such as cumulative distribution function, probability density function, and Gaussian distribution. X-ray diffraction and its application in phase analysis of materials is discussed as well.
Covers a wide range of concepts and techniques for accurate characterization of the microstructure of a variety of materials, including metals, ceramics, and polymers
Outlines spectroscopic, scanning electron microscope, X-ray diffraction, and other characterization methods
Discusses microscopy fundamentals, statistical analysis, and sample preparation methods
