Hafizur Rahaman | Akateeminen Kirjakauppa

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PROGRESS IN VLSI DESIGN AND TEST - 16TH INTERNATIONAL SYMPOSIUM ON VSLI DESIGN AND TEST, VDAT 2012, SHIPUR, INDIA, JULY 1-4, 201

Hafizur Rahaman; Sanatan Chattopadhyay; Santanu Chattopadhyay
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG (2012)
Pehmeäkantinen kirja

49,60 €

CARBON NANOTUBE AND GRAPHENE NANORIBBON INTERCONNECTS

Debaprasad Das; Hafizur Rahaman
Taylor & Francis Inc (2014)
Kovakantinen kirja

238,70 €

CARBON NANOTUBE AND GRAPHENE NANORIBBON INTERCONNECTS

Debaprasad Das; Hafizur Rahaman
Taylor & Francis Ltd (2017)
Pehmeäkantinen kirja

92,80 €

REVERSIBLE COMPUTATION - 9TH INTERNATIONAL CONFERENCE, RC 2017, KOLKATA, INDIA, JULY 6-7, 2017, PROCEEDINGS

Iain Phillips; Hafizur Rahaman
Springer International Publishing AG (2017)
Pehmeäkantinen kirja

49,60 €

EMERGING ELECTRONIC DEVICES, CIRCUITS AND SYSTEMS : SELECT PROCEEDINGS OF EEDCS WORKSHOP HELD IN CONJUNCTION WITH ISDCS 2022

Chandan Giri (ed.); Takahiro Iizuka (ed.); Hafizur Rahaman (ed.); Bhargab B. Bhattacharya (ed.)
Springer (2023)
Kovakantinen kirja

215,70 €

EMERGING ELECTRONIC DEVICES, CIRCUITS AND SYSTEMS - SELECT PROCEEDINGS OF EEDCS WORKSHOP HELD IN CONJUNCTION WITH ISDCS 2022

Chandan Giri; Takahiro Iizuka; Hafizur Rahaman; Bhargab B. Bhattacharya
Springer Verlag, Singapore (2024)
Pehmeäkantinen kirja

215,70 €

Progress in VLSI Design and Test - 16th International Symposium on VSLI Design and Test, VDAT 2012, Shipur, India, July 1-4, 201

Hafizur Rahaman, Sanatan Chattopadhyay, Santanu Chattopadhyay

49,60 €

Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Sivumäärä: 408 sivua
Asu: Pehmeäkantinen kirja
Painos: 2012 ed.
Julkaisuvuosi: 2012, 02.07.2012 (lisätietoa)
Kieli: Englanti
Tuotesarja: Theoretical Computer Science and General Issues

This book constitutes the refereed proceedings of the 16th International Symposium on VSLI Design and Test, VDAT 2012, held in Shibpur, India, in July 2012.
The 30 revised regular papers presented together with 10 short papers and 13 poster sessions were carefully selected from 135 submissions.
The papers are organized in topical sections on VLSI design, design and modeling of digital circuits and systems, testing and verification, design for testability, testing memories and regular logic arrays, embedded systems: hardware/software co-design and verification, emerging technology: nanoscale computing and nanotechnology.

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