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David Attwood (ed.) | Akateeminen Kirjakauppa

X-RAY MICROSCOPY : PROCEEDINGS OF THE SIXTH INTERNATIONAL CONFERENCE BERKELEY, CA, 2-6 AUGUST 1999

X-Ray Microscopy : Proceedings of the Sixth International Conference Berkeley, CA, 2-6 August 1999
Werner Meyer-Ilse (ed.); Tony Warwick (ed.); David Attwood (ed.)
American Institute of Physics (2000)
Kovakantinen kirja
117,10
Tuotetta lisätty
ostoskoriin kpl
Siirry koriin
X-Ray Microscopy : Proceedings of the Sixth International Conference Berkeley, CA, 2-6 August 1999
117,10 €
American Institute of Physics
Sivumäärä: 748 sivua
Asu: Kovakantinen kirja
Painos: 2000
Julkaisuvuosi: 2000, 19.05.2000 (lisätietoa)
Kieli: Englanti
Tuotesarja: Atomic, Molecular, Chemical Physics
This volume is the status report of the international community of practitioners of x-ray microscopy. It contains the reviews and work presented at the 6th International Conference on X-Ray Microscopy held in Berkeley, 2-6 August 1999. The techniques are being applied to biological imaging where, for example, special labeling can reveal the location of specific proteins in cells, while cryogenic sample handling prevents x-ray damage to cells. These techniques can also be used to analyze objects on a 10 nm size scale, allowing the study of their physical and chemical state. For example, chemical processes in the environment can be examined on the surfaces of microscopic particulate matter. The availability of several new soft x-ray synchrotron light sources around the world is facilitating the development of new applications. This conference showed that large new programs have become productive at these new synchrotron sources.

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X-Ray Microscopy : Proceedings of the Sixth International Conference Berkeley, CA, 2-6 August 1999
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ISBN:
9781563969263
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