Tekijä: C.A.J. Ammerlaan; Max Schulz (ed.); W. Bergholz; B. Clerjaud; H. Ennen; H.G. Grimmeiss; B. Hamilton; U. Kaufmann; Münch Kustantaja: Springer (1989) Saatavuus: Ei tiedossa
Tekijä: C.A.J. Ammerlaan; H. Bracht; E.E. Haller; R. Murray; R.C. Newman; R. Sauer; N.A. Stolwijk; J. Weber; W. Zulehner Kustantaja: Springer (2002) Saatavuus: Ei tiedossa
Tekijä: F F Bekker; C A J Ammerlaan; Nguyen Van Hieu; J J M Franse; Than Duc Hien Kustantaja: World Scientific Publishing Company (1991) Saatavuus: Ei tiedossa
EUR 212,90
Impurities and Defects in Group IV Elements and III-V Compounds / Störstellen und Defekte in Elementen der IV. Gruppe und III-V-
Springer Sivumäärä: 776 sivua Asu: Kovakantinen kirja Painos: 1989 Julkaisuvuosi: 1989, 12.12.1989 (lisätietoa) Kieli: Englanti
Subvolume III/22b of the Landolt-Börnstein New Series presents a comprehensive data compilation on defects and impurities in the elemental semiconductors and in the III-V compounds. Data on semiconductor defects were already included in the extended data collection on semiconductors in volumes III/17a...i. Research on semiconductor defects and impurities, however, advanced so rapidly during recent years that a new subvolume on this important topic seemed desirable. The information given in subvolume III/22b ranges from trends on defect properties as predicted by theory and a survey of diagnostic techniques to extensive tables and graphical representations of defect properties. The editor and the authors have endeavoured to find a unified form and to critically select the important and reliable information from the wide range of published data. Discussions of ambiguous results or textbook style explanations are avoided.
