Mingming Zhang; Zhiwei Peng; Bowen Li; Sergio Neves Monteiro; Rajiv Soman; Jiann-Yang Hwang; Yunus Eren Kalay; Escobedo-D Springer International Publishing AG (2024) Pehmeäkantinen kirja
Shadia Ikhmayies; Bowen Li; John S. Carpenter; JIan Li; Jiann-Yang Hwang; Sergio Neves Monteiro; Donato Firrao; Mi Zhang Springer International Publishing AG (2017) Kovakantinen kirja
Bowen Li; Jian Li; Shadia Ikhmayies; Mingming Zhang; Yunus Eren Kalay; John S. Carpenter; Jiann-Yang Hwang; Ser Monteiro Springer International Publishing AG (2018) Kovakantinen kirja
Bowen Li; Jian Li; Shadia Ikhmayies; Mingming Zhang; Yunus Eren Kalay; John S. Carpenter; Jiann-Yang Hwang; Ser Monteiro Springer Nature Switzerland AG (2019) Kovakantinen kirja
Bowen Li; Jian Li; Shadia Ikhmayies; Mingming Zhang; Yunus Eren Kalay; John S. Carpenter; Jiann-Yang Hwang; Ser Monteiro Springer International Publishing AG (2019) Pehmeäkantinen kirja
Shadia Ikhmayies; Bowen Li; John S. Carpenter; Jiann-Yang Hwang; Sergio Monteiro; Jian Li; Donato Firrao; Mingming Zhang John Wiley & Sons Inc (2016) Kovakantinen kirja
John Carpenter; Chengguang Bai; J. Pablo Escobedo-Diaz; Jiann-Yang Hwang; Shadia Ikhmayies; Bowen Li; Jian Li; Neves Mont Springer International Publishing AG (2016) Kovakantinen kirja
Bowen Li; Shefford P. Baker; Huazhang Zhai; Sergio Neves Monteiro; Rajiv Soman; Faqin Dong; Jinhong Li; Ruigang Wang Springer Nature Switzerland AG (2020) Kovakantinen kirja
Bowen Li; Shefford P. Baker; Huazhang Zhai; Sergio Neves Monteiro; Rajiv Soman; Faqin Dong; Jinhong Li; Ruigang Wang Springer Nature Switzerland AG (2021) Pehmeäkantinen kirja
Bowen Li (ed.); Dipankar Ghosh (ed.); Eugene A. Olevsky (ed.); Kathy Lu (ed.); Faqin Dong (ed.); Jinhong Li (ed.); R Wang Springer (2023) Kovakantinen kirja
The collection focuses on the advancements of characterization of minerals, metals, and materials and the applications of characterization results on the processing of these materials. Advanced characterization methods, techniques, and new instruments are emphasized. Areas of interest include, but are not limited to:
• Novel methods and techniques for characterizing materials across a spectrum of systems and processes.
• Characterization of mechanical, thermal, electrical, optical, dielectric, magnetic, physical, and other properties of materials.
• Characterization of structural, morphological, and topographical natures of materials at micro- and nano- scales.
• Characterization of extraction and processing including process development and analysis.
• Advances in instrument developments for microstructure analysis and performance evaluation of materials, such as computer tomography (CT), X-ray and neutron diffraction, electron microscopy (SEM,FIB, TEM), and spectroscopy (EDS, WDS, EBSD) techniques.
• 2D and 3D modelling for materials characterization.
